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Management method and device based on test defect data

A defect and data technology, applied in the field of management methods and devices based on test defect data, can solve problems such as waste, missed test resources, poor reliability, etc.

Active Publication Date: 2019-10-18
电信科学技术第十研究所有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Embodiments of the present invention provide a management method and device based on test defect data, which are used to solve defects such as poor reliability and low resource utilization in the existing software product test case quality optimization and human resource arrangement, resulting in missed tests and The problem of waste of test resources

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  • Management method and device based on test defect data

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Embodiment Construction

[0045]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0046] figure 1 It exemplarily shows a schematic flowchart of a management method based on test defect data provided by an embodiment of the present invention, and the method mainly includes the following steps:

[0047] Step 101, determine the scoring rules of the defective software to be tested by the Delphi method, and determine the defect severity of each piece of defect data included in the software to be tested according to the severity of the defect in t...

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Abstract

The invention discloses a management method and device based on test defect data, and relates to the field of software testing. The method and the device are used for solving the problems of missing test and test resource waste of the existing software product test. The method comprises the following steps: determining a scoring rule of defect software to be tested and a discrete factor of each piece of defect data through a Delphi method; determining a correction function weight of each module according to importance degrees and operation logs of a plurality of modules included in software with defects to be tested; determining a defect discrete factor of each module according to the discrete factors of the multiple pieces of defect data, and determining defect dispersion of each module and average defect dispersion of the defect software to be tested according to the defect discrete factors and the correction function weight; and determining the modules of which the defect dispersionis greater than the average defect dispersion as repair modules, and performing case quality improvement and manpower time adjustment on the repair modules.

Description

technical field [0001] The invention relates to the field of computer software testing, and in particular to a management method and device based on test defect data. Background technique [0002] Software testing is an indispensable stage in the software development process. Since the 1970s, the industry has recognized that in a typical programming project, testing will account for half or more of the time and resources, especially in recent years with rapid development The big data technology needs to rely on effective software testing, but it also builds an obstacle wall for how to improve the quality and efficiency of testing, which makes testers think about how to test comprehensively at the beginning of testing, and how to test in the process of testing. Quickly and accurately find defects in software products. This itself requires not only excellent technical support, but also quality improvement in each test link to minimize worthless work. For example, the followin...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3672G06F11/3692Y02P90/30
Inventor 刘博白丹赵越
Owner 电信科学技术第十研究所有限公司
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