Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Voltage sag reason identification method and system

A voltage sag and recognition method technology, which is applied in character and pattern recognition, pattern recognition in signals, instruments, etc., can solve the problems of poor real-time performance and low recognition accuracy of voltage sag causes, and reduce the calculation scale and provide real-time The effects of improved performance and recognition accuracy

Inactive Publication Date: 2019-09-17
GLOBAL ENERGY INTERCONNECTION RES INST CO LTD +2
View PDF7 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Therefore, a method and system for identifying the cause of a voltage sag provided by the present invention overcomes the shortcomings of low precision and poor real-time performance in identifying the cause of a voltage sag in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Voltage sag reason identification method and system
  • Voltage sag reason identification method and system
  • Voltage sag reason identification method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] An embodiment of the present invention provides a method for identifying the cause of a voltage sag, such as figure 1 As shown, the method includes the following steps:

[0028] Step S1: Obtain key waveforms to be identified that include voltage sag events in the online voltage data.

[0029] In the embodiment of the present invention, the sag waveform of online data is captured within a preset time window (for example, a time window of 1 min), and the waveform data with the deepest sag depth is selected as the key waveform.

[0030] Step S2: Dimensionality reduction is performed on the key waveform to be identified to obtain the feature vector of the key waveform to be identified.

[0031] In the embodiment of the present invention, the number of sampling points in the power quality monitoring terminal is 128, and the power frequency is 50hz, so the number of data points in 1 minute is 384,000, and the data dimension of the key waveform to be identified is relatively ...

Embodiment 2

[0068] An embodiment of the present invention provides a voltage sag cause identification system, such as Figure 6 As shown, the system includes:

[0069] The key waveform acquisition module 1 to be identified is used to acquire key waveforms to be identified including voltage sag events in the online voltage data; this module executes the method described in step S1 in Embodiment 1, which will not be repeated here.

[0070] The feature vector acquisition module 2 is used to reduce the dimensionality of the key waveform to be identified to obtain the feature vector of the key waveform to be identified; this module executes the method described in step S2 in Embodiment 1, which will not be repeated here .

[0071] The cause type obtaining module 3 is configured to obtain the cause type of the voltage sag event according to the feature vector. This module executes the method described in step S3 in Embodiment 1, which will not be repeated here.

[0072] The voltage sag cause...

Embodiment 3

[0074] An embodiment of the present invention provides a computer device, such as Figure 7 As shown, it includes: at least one processor 401 , such as a CPU (Central Processing Unit, central processing unit), at least one communication interface 403 , memory 404 , and at least one communication bus 402 . Wherein, the communication bus 402 is used to realize connection and communication between these components. Wherein, the communication interface 403 may include a display screen (Display) and a keyboard (Keyboard), and the optional communication interface 403 may also include a standard wired interface and a wireless interface. The memory 404 may be a high-speed RAM memory (Ramdom Access Memory, volatile random access memory), or a non-volatile memory (non-volatile memory), such as at least one disk memory. Optionally, the memory 404 may also be at least one storage device located away from the aforementioned processor 401 . The processor 401 may execute the method for ide...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a voltage sag reason identification method and system. The method comprises the steps of obtaining a to-be-identified key waveform containing a voltage sag event in the online voltage data; carrying out dimensionality reduction on the to-be-identified key waveform to obtain a feature vector of the to-be-identified key waveform; and obtaining the reason type of the voltage sag event according to the feature vector. According to the method, an original data-feature data mapping relationship is automatically established from the historical sample data based on an automatic encoder, so that the problem that the feature quantity is ignored due to the cognitive defects in the prior art is avoided, more feature information can be mined, and the recognition precision is further improved. The sag event waveform data is subjected to the dimensionality reduction through the automatic encoder to obtain the feature vector, and then the feature vector is input into the classifier to obtain the reason type of the voltage sag event, so that the calculation scale is effectively reduced, and the real-time performance of the online identification is provided.

Description

technical field [0001] The invention relates to the field of power quality analysis, in particular to a method and system for identifying causes of voltage sags. Background technique [0002] Voltage sag refers to an event in which the root mean square value of the supply voltage suddenly drops to 90% to 1% of the rated value in a short period of time, and its typical duration is 10ms to 1min. The main causes of voltage sag are short-circuit fault, transformer input and induction motor start-up. Due to different reasons, the voltage sags caused are also different. How to effectively distinguish the cause of voltage sag is very important to the prevention and treatment of voltage sag, and it can also provide a basis for resolving disputes between users and the system. [0003] At present, there are mainly two methods for identifying the cause of voltage sags. One method is to extract the eigenvalues ​​in the voltage sag waveform through mathematical transformation, and then...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/00
CPCG06F2218/10G06F2218/12
Inventor 冯丹丹王同勋刘颖英周胜军谈萌
Owner GLOBAL ENERGY INTERCONNECTION RES INST CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com