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Multifunctional diode testing device and operating method thereof

A technology of testing device and operation method, which is applied in the direction of measuring device, single semiconductor device testing, measuring electricity, etc., can solve the problems of cutting legs without diodes, less diodes, inaccurate test results, etc., and achieves diversified functions and good results. Stability and the effect of improving test efficiency

Active Publication Date: 2019-09-13
ANHUI MINGYANG ELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] There are certain drawbacks in the use of the existing diode testing device. The existing diode testing device has a single function, only has the testing function, and does not have other functions such as cutting the legs of the diode, and the existing diode testing device is testing The number of diodes that can be tested at one time is small, and multiple diodes cannot be tested at one time. In addition, the existing diode test device does not have the function of heat preservation, which may interfere with the test results of the diodes due to the influence of temperature, resulting in Inaccurate, which has a certain impact on actual use

Method used

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  • Multifunctional diode testing device and operating method thereof
  • Multifunctional diode testing device and operating method thereof
  • Multifunctional diode testing device and operating method thereof

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Embodiment Construction

[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0033] Such as Figure 1-7 As shown, a multifunctional diode testing device includes a test bench 1, two sets of limit grooves 2 are provided on the top of the test bench 1, and the top of the test bench 1 is embedded between the two sets of limit grooves 2. Test panel 3, the top of test panel 3 is provided with positioning plate 4, and the top of test stand 1 is provided with cutting disk 5 by the side wall of test panel 3, and the rear end of test stand 1 is equipped with suppor...

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Abstract

The invention discloses a multifunctional diode testing device comprising a test bench; two groups of limiting grooves are formed in the top end of the test bench, a test panel is embedded between thetwo groups of limiting grooves at the top end of the test bench, a positioning plate is arranged at the top end of the test panel, a cutting disc is installed close to the side wall of the test panelat the top end of the test bench, a supporting plate is arranged at the rear end of the test bench, and a connecting plate is arranged close to the top end at the front end of the supporting plate. According to the multifunctional diode testing device in the invention, the positioning plate is arranged, a plurality of positioning grooves are formed in the positioning plate, so that the diodes canbe well fixed and positioned, a plurality of diodes can be tested at the same time in cooperation with the test panel, the testing efficiency is improved, diode support arms can be cut by arranging the cutting disc, due to the arrangement of a heat preservation box, the storage of the diodes can be facilitated and heating can be realized, and the interference of the temperature on the diode testis effectively avoided.

Description

technical field [0001] The invention belongs to the technical field of diode testing, and in particular relates to a diode testing device, more specifically a multifunctional diode testing device and an operation method thereof. Background technique [0002] In the production of diodes, the finished diodes need to be tested to confirm whether the diodes can be energized normally. Therefore, it is necessary to use a test device to test the diodes. When the diodes are powered on, it means that the diodes are energized normally. Otherwise, it indicates that the diodes are in poor contact. , in this way to judge whether the diode is energized normally. [0003] There are certain drawbacks in the use of the existing diode testing device. The existing diode testing device has a single function, only has the testing function, and does not have other functions such as cutting the legs of the diode, and the existing diode testing device is testing The number of diodes that can be te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 陈敏顾亚英邓肖肖
Owner ANHUI MINGYANG ELECTRONICS
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