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Recording method for test result of integrated circuit mechanical arm

A technology for test results and recording methods, applied in electronic circuit testing, single semiconductor device testing, components of electrical measuring instruments, etc., it can solve the problems that the data cannot correspond to each data, and the chip traceability cannot be traced, so as to achieve convenient testing. the effect of the result

Inactive Publication Date: 2019-05-28
SINO IC TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, after the test of the test robot is completed, the chip can only be divided into multiple Tray disks according to different Bins, and the source of the chip cannot be traced. After the test of the test machine is completed, the corresponding data cannot be corresponding to each data.

Method used

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  • Recording method for test result of integrated circuit mechanical arm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0064] Wafer Test: Test the DUT on the wafer using test equipment.

[0065] Finished product testing: Use test equipment to test the packaged finished circuit.

[0066] Tray: A container for storing finished circuits.

[0067] Datalog: The detailed data of the test, including the coordinates of the device under test on the wafer, the name of the test item, the test value, the test condition, the judgment condition, etc.

[0068] This method is suitable for testing integrated circuit semiconductor devices.

[0069] as attached figure 1 As shown, the first coordinate of the upper left corner is defined as (1,1), in turn, the second in the first line is (2,1), and the first in the second line is (1,2), so as to generate a coordinate system ;The first part of each file is recorded as the basic information of the TrayMap, and the recorded information and format are as follows:

[0070] TrayMap file version: C

[0071] Tray disc number: S

[0072] Tray tray batch number: S

...

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Abstract

The invention discloses a recording method for a test result of an integrated circuit mechanical arm. A TrayMap file includes two record parts, the first part comprises integral information of whole Tray disks, a TrayMap file version, a serial number of each Tray disk, batch numbers of products corresponding to the Tray disks, start test time of the Tray disks, end test time of the Tray disks, a serial number of the mechanical arm, a serial number of an operator, called configuration file information, the coordinate range of a TrayMap and Summary information; the invention relates to a TrayMaprecording method. Records comprise test time, test Bin, total test time and the like of all chips of each Tray disk. According to the record file, the test result can be conveniently analyzed, and according to the TrayMap file, a detailed Datalog of each chip generated from a test machine can be traced to the source.

Description

technical field [0001] The invention relates to the technical field of integrated circuit semiconductor device testing, in particular to a method for recording test results of an integrated circuit manipulator. Background technique [0002] In integrated circuit semiconductor device testing, manipulators are usually used for finished product testing. Different from wafer testing, finished circuits usually do not have obvious identification such as batch number, piece number, coordinates, etc. like wafers for traceability of test data. Similar to the map used in wafer testing, a file is also required to record the map of wafer testing in finished product testing. At present, after the test of the test robot is completed, the chip can only be divided into multiple Tray disks according to different Bins, and the source of the chip cannot be traced. After the test of the test machine is completed, the corresponding data cannot be corresponding to each data. Contents of the in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28G01R1/02
Inventor 邵嘉阳祁建华徐倩云朱成兼凌俭波吴勇佳
Owner SINO IC TECH
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