Glass substrate retesting and repairing system and method thereof

Abstract

A glass substrate remeasurement and rework system and method thereof, wherein the glass substrate remeasurement and rework system comprises an electrical measuring station, a laser repairing machine, a laser long-line machine, a branching re-measurement station and a re-measurement electrical measuring station. The electrical measuring station electrically measures whether each of the panels of the glass substrate has defects. The laser repairing machine marks an abnormal level for the panel with the defect, and diverts the remaining glass substrates with the abnormal level. The laser line machine repairs the panel having the abnormal level. The separating and retesting station separates the normal and abnormal glass substrates. The re-measurement electrical measuring station identifies the abnormal glass substrate. When the panel has an abnormal level, the panel with the abnormal level is re-measured, and is diverted to the laser repairing machine or the laser long-line machine for re-repair according to the type of defect, so as to reduce the damage caused by re-measurement and re-repair. Loss of capacity and time cost.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a glass substrate retesting and repairing system and method thereof. Background technique [0002] As the demand for large-sized panels is increasing day by day, the newer generation of factories requires larger glass substrates. Larger-sized glass substrates can be cut into larger and more panels to achieve the purpose of reducing costs and expanding economic benefits. As far as the existing liquid crystal panel production equipment is concerned, the T200 (array test) site is used as an electrical measurement site for the thin film transistor liquid crystal display (TFT-LCD) array test area. The main function of the T200 station is to measure the electrical value of the line in the glass substrate, and at the same time generate abnormal data information (such as abnormal type, position coordinates, etc.), and pass the abnormal information to T300 (final repair) through the data...

AI Technical Summary

Problems solved by technology

However, since the wiring of each panel is very precise, there may be deviations in the measurement, resulting in the failure of effective repairs at the T300 site, resulting in the need for retesting and repairing of abnormal products, thus wasting the measurement capacity of the T200 site and the repair capacity of the personnel at the T300 site

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