Testing system and method of JESD204B protocol high-speed sender single-particle error rate

Abstract

The invention discloses a testing system and method of a JESD204B protocol high-speed sender single-particle error rate. The testing system is built by a high-speed sender and a programmable logic device. The programmable logic device generates parallel data to a parallel end of the high-speed sender, the high-speed sender is configured at the same time, serial data generated by the high-speed sender are sent to the programmable logic device, serial-to-parallel conversion is carried out, and then the programmable logic device parses low-speed data, and detects the single-particle error rate ofthe high-speed sender. According to the system, a single-particle machine time utilization rate is effectively improved, a data link is complete, the programmable logic device is utilized for deserializing on the high-speed serial data to form the low-speed parallel data for processing rather than using expensive instruments such as error code instruments and high-speed oscilloscopes for monitoring, high-speed signal testing stability is improved, and test costs are reduced; and automatic classification is carried out according to different error types for counting, and testing efficiency isimproved.

Description

technical field [0001] The invention relates to a test method for the single event error rate of a JESD204B protocol high-speed transmitter, belonging to the technical field of semiconductor integrated circuit anti-space single event effect verification technology. Background technique [0002] With the rapid development of aerospace technology, the bus transmission bandwidth has become a key factor limiting the overall performance of the spacecraft. The traditional data bus can no longer meet the increasing amount of communication data. Therefore, it is necessary to develop a newer high-speed interface to improve data transmission efficiency. The key, the JESD204B series transmitter interface adopts high-speed serial link transmission, which can effectively solve the problems faced by the data bus. When the spacecraft is in the harsh space radiation environment for a long time, the electronic equipment is easily affected by the radiation effect of space particles, resulting...

AI Technical Summary

Problems solved by technology

[0003] The technical solution problem of the present invention is: overcome the weak point of prior art, provide a kind of JESD204B protocol high-speed sender single event error rate test system and method, this method utilizes programmable logic device to convert high-speed serial data into low-speed Parallel data is used to test the single event error rate, thereby overcoming the shortcomings of high-speed signal testing that requires high testing environment, poor stability, and expensive instruments such as bit error detectors that need to be transported to the test site for testing

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