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Metallographic corrosive agent and metallographic structure display method of crimped core wire

A technology of metallographic structure display and etchant, applied in the field of metallographic structure display and metallographic etchant, can solve the problems of poor effect, difficult to control the degree of corrosion, cumbersome method and steps of crimping the core wire, etc., and achieve the effect of improving the corrosion efficiency.

Pending Publication Date: 2019-04-05
FOXCONN (KUNSHAN) COMPUTER CONNECTOR CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, in the prior art, the effect of layered metallographic microstructure display on several core wires after crimping with alloy copper layer is relatively poor, and the method and steps of performing metallographic microstructure display on crimped core wires are cumbersome
For example, the electrolytic corrosion of core wire and copper alloy will be affected by factors such as voltage, current, temperature and time, and the degree of corrosion is difficult to control

Method used

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  • Metallographic corrosive agent and metallographic structure display method of crimped core wire
  • Metallographic corrosive agent and metallographic structure display method of crimped core wire

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Embodiment Construction

[0019] In order to enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be described in detail below in conjunction with specific examples. The display method includes the following steps:

[0020] The first step is to provide metallographic samples of several copper wires and copper alloy wires, such as figure 1 As shown, the metallographic sample includes several core wire copper layers 11 and a copper alloy layer 12 surrounding and crimping outside the several core wire copper layers 11. It can be seen that the core wire copper layer 11 located inside is almost In an integrated form, the boundary lines between the core wires cannot be distinguished at all, and the copper layer 11 of the core wire and the copper alloy layer 12 have a certain boundary, but it is not very obvious;

[0021] In the second step, a container (not shown) is provided, the metallographic sample is fixed into the container w...

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Abstract

The invention provides a metallographic structure display method of a crimped core wire. The display method comprises the following steps: step1, providing a metallographic sample of a plurality of copper wire and copper alloy wires, wherein the metallographic sample comprises a plurality of core wire copper layers and copper alloy layers surrounding and crimping outside the plurality of core wirecopper layers; step2, adding a polyster; step3, mechanically grinding the metallographic sample, and performing mechanical polishing on the grinded metallographic sample; step4, providing a metallographic corrosive agent, and impregnating the metallographic corrosive agent with the metallographic sample for metallographic micro corrosive, wherein the metallographic corrosive agent is a mixed solution of ferric chloride, hydrochloric acid and alcohol; and step5, washing and drying the corroded metallographic sample, and observing a multi-core copper layer and the copper alloy layer of the dried metallographic sample by a microscope, thereby clearly showing the boundary between the core wire copper layer and the copper alloy layer after crimping, and facilitating observation of the crimpingeffect between the core wires and between the core wires and the alloy copper layer.

Description

【Technical field】 [0001] The invention relates to a metallographic structure observation test technology, in particular to a metallographic etchant applied to the metallographic microstructure observation of a plurality of core wires crimped with an alloy copper layer, and a method for displaying the metallographic structure of the crimped core wires. 【Background technique】 [0002] The internal structure of metal materials is directly and closely related to material properties such as hardness, strength, and ductility. Metallographic observation is the most direct and effective method for studying the internal structure of metal materials. Metallographic refers to the chemical composition of metal or alloy and the physical state and chemical state of various components inside the metal or alloy. The metallographic microstructure observation method can be used to observe the boundaries and thicknesses of different metal or alloy layers. Among them, the observation of the me...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84G01N1/28G01N1/32
CPCG01N1/28G01N1/32G01N21/84G01N23/22G01N23/2202
Inventor 陈祖鹏童浩高丽珠梁超戴新国
Owner FOXCONN (KUNSHAN) COMPUTER CONNECTOR CO LTD
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