Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sample holder of transmission electron microscope

An electron microscope, sample rod technology, used in material analysis, measuring devices, instruments, etc. using wave/particle radiation, to achieve the effect of broadening the observation of microscopic changes

Pending Publication Date: 2019-03-19
厦门芯极科技有限公司
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention provides a transmission electron microscope sample rod to at least solve the problem in the prior art that the electron microscope sample rod can only observe the microstructure of fixed and packaged samples

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sample holder of transmission electron microscope
  • Sample holder of transmission electron microscope
  • Sample holder of transmission electron microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0021] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence.

[0022] The embodiment of the present invention discloses a transmission electron ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a sample holder of a transmission electron microscope. The sample holder comprises an optical fiber access joint, an optical fiber, a grip, a first sample holder unit, a secondsample holder unit and a sample holder end; the optical fiber access joint is mounted at one end of the grip, one end of the first sample holder unit is connected with the other end of the grip, theother end of the first sample holder unit is connected with one end of the second sample holder unit, and the other end of the second sample holder unit is connected with the sample holder end; a sample container is formed in the sample holder end; the optical fiber access joint comprises an optical input terminal and an optical output terminal; the optical fiber is inserted in the grip, the firstsample holder unit, and the second sample holder unit, one end of the optical fiber is connected with the optical output terminal of the optical fiber access joint, and the other end of the optical fiber is connected with the sample container of the sample holder end. The sample holder of the transmission electron microscope can supply specific-wavelength laser and specific current to the packaged samples, and thus, effective observation and measurement to micro-changes of substances under the condition of lighting or charging catalysis can be achieved.

Description

technical field [0001] The invention relates to a sample rod of a transmission electron microscope, in particular to an in-situ chip fixing structure of a sample rod of a transmission electron microscope. Background technique [0002] As a kind of microscopic observation equipment, transmission electron microscope can effectively display the submicrostructure or ultrastructure of materials, which is convenient for the research of materials. However, the existing electron microscope sample rod provided by the manufacturer has a single function, and can only observe the microstructure of fixed and packaged samples, which has limitations in material research, and cannot observe and simulate real-time microscopic changes of materials under other conditions, especially the observation of materials. The changes produced by light irradiation and the inability to observe the changes produced by electrification of materials severely limit the research and progress of materials. Con...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20025
CPCG01N23/20025
Inventor 邱晓滨欧阳亮洪丽川
Owner 厦门芯极科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products