Sample holder of transmission electron microscope
An electron microscope, sample rod technology, used in material analysis, measuring devices, instruments, etc. using wave/particle radiation, to achieve the effect of broadening the observation of microscopic changes
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[0020] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0021] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence.
[0022] The embodiment of the present invention discloses a transmission electron ...
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