Intelligent test device for medium and low frequency circuits and test method therefor

Abstract

The invention relates to an intelligent test device for medium and low frequency circuits and a test method therefor. The test device comprises a universal test adapter for mating with an electronic device to be tested, and an ATE device for mating with the universal test adapter. The ATE device comprises a main control computer, a PXI and VXI bus instrument combination, an LXI-C / GPIB desktop instrument, a combined power supply, an electronic control combination, a channel expansion combination, a common test signal interface ICA, and a self-test adaptive device. The specific steps are as follows: (1) test generation; (2) test simulation; and (3) fault diagnosis. Compared with the prior art, the fault diagnosis and repair difficulty of a circuit board in the active equipment are solved, the universality, the reusability and the convenience of the equipment provide the beneficial effects for intelligent testing of the circuit board, and the software system platform and the system thereof can be combined with other software, so that the compatibility of the software is improved.

Description

technical field [0001] The invention relates to the detection field of medium and low frequency circuits, in particular to an intelligent testing device and a testing method for medium and low frequency circuits. Background technique [0002] The Air Force's active main combat aircraft have been in service for a relatively short period of time, and they need to be maintained for a long time; and the rapid development of military technology also requires the establishment of electronic equipment maintenance and support capabilities based on the present and facing the future. Due to the tense military struggle situation, military equipment will be prepared for war for a long time and will be in continuous operation, resulting in a large increase in maintenance and support tasks. It is also necessary to enhance the technical level of current maintenance and support equipment, especially the automation level. Airborne electronic equipment has developed from "double-layer board +...

AI Technical Summary

Problems solved by technology

[0003] At present, the test methods for medium and low frequency airborne module circuits are mainly based on digital IO, logic level and low-speed electrical signals. Signal generators and spectrum analyzers are used to provide incentives for the chips under test, and oscilloscopes are used to collect and compare signals. The method has shortcomings such as single function, low degree of automation, poor standardization, and high cost. There are also problems such as difficult test process set development and insufficient intelligence in chip test and diagnosis methods.

[0004] In recent years, due to the development of new technologies, corresponding research has been done for different needs, but they are all scattered and one-sided research, lacking a comprehensive testing method for the entire circuit board

Existing capabilities have been unable to meet various test requirements for boards, such as comprehensive tests for new bus, boundary scan, video, and angle signals. There is an urgent need for a comprehensive test method to meet the needs of circuit boards in active equipment. fault diagnosis and repair

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