A light emitting diode epitaxial wafer and a manufacturing method thereof
A technology of light-emitting diodes and manufacturing methods, which is applied to electrical components, circuits, semiconductor devices, etc., can solve the problems of increased heat generation of LED chips, decreased LED luminous efficiency, and hindrance to hole movement, so as to reduce overflow and reduce migration rate , to reduce the blocking effect
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Embodiment 1
[0032] An embodiment of the present invention provides a light emitting diode epitaxial wafer, figure 1 It is a schematic structural diagram of a light-emitting diode epitaxial wafer provided by an embodiment of the present invention, as shown in figure 1 As shown, the light-emitting diode epitaxial wafer includes a substrate 1, a buffer layer 2, an undoped GaN layer 3, an N-type layer 4, a stress release layer 5, a multi-quantum well layer 7 and a P Type layer 8. The multi-quantum well layer 7 is a multi-period superlattice structure, and each superlattice structure includes an InGaN quantum well layer 71 and a GaN quantum barrier layer 72 grown on the InGaN quantum well layer 71 . The stress release layer 5 is a multi-period superlattice structure, and each superlattice structure includes a GaN layer 51 and an InGaN layer 52 grown on the GaN layer 51 .
[0033] The light-emitting diode epitaxial wafer also includes an electric field regulation layer 6 arranged between the ...
Embodiment 2
[0053] An embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer, which is used to manufacture the light-emitting diode epitaxial wafer provided in Embodiment 1, figure 2 It is a method flowchart of a method for manufacturing a light-emitting diode epitaxial wafer provided by an embodiment of the present invention, as shown in figure 2 As shown, the manufacturing method includes:
[0054] Step 201, providing a substrate.
[0055] In this embodiment, the substrate is sapphire.
[0056] Step 201 also includes:
[0057] The temperature of the reaction chamber is controlled at 1050° C., the pressure is 200-500 Torr, the sapphire substrate is annealed in a pure hydrogen atmosphere for 5-6 minutes, and then the sapphire substrate is nitrided.
[0058] In this embodiment, Veeco K465i or C4 MOCVD (Metal Organic Chemical Vapor Deposition, Metal Organic Compound Chemical Vapor Deposition) equipment can be used to realize the L...
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