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Photon sieve aberration analysis method

An analysis method and photon sieve technology, applied in optics, optical components, instruments, etc., can solve the problems that the derivation cannot be carried out, the establishment of the photon sieve transmission function is difficult, and it is not applicable

Inactive Publication Date: 2018-12-18
SOUTHWEST RES & DESIGN INST OF CHEM IND
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Problems solved by technology

In this way, it will be extremely difficult to establish the photon sieve transmission function, even if the analytical function is established, the subsequent derivation will not be possible
Therefore, the aberration calculation method of the zone plate is not suitable for the calculation of the photon sieve aberration, and a new idea is needed to calculate

Method used

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  • Photon sieve aberration analysis method
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Embodiment Construction

[0062] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0063] Any feature disclosed in this specification (including the abstract and drawings), unless specifically stated, can be replaced by other equivalent or similar purpose alternative features. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0064] According to a photon sieve aberration analysis method provided by the present invention, such as figure 1 As shown, starting from the mathematical relationship between the phase of the pupil surface of the photon sieve and the point spread function, the diffraction model of ...

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Abstract

The invention provides a photon sieve aberration analysis method. A photon sieve diffraction model is built according to a mathematical relationship between a phase of a pupil plane of a photon sieveand a point spread function, and the point spread function of the photon sieve is calculated; and the phase of the pupil plane of the photon sieve is reversely derived according to the point spread function of the photon sieve, namely, the phase of the pupil plane is an equivalent wave aberration of the photon sieve. Compared with the prior art, the method has the advantages that inertial thinkingis broken through, and starting from the mathematical relationship between the phase of the pupil plane of the photon sieve and the point spread function, the phase of the pupil plane of the photon sieve is reversely derived according to the point spread function of the photon sieve. The wave aberration is an important evaluation index of an optical system, and single aberrations such as a spherical aberration, a coma aberration, astigmatism, field curvature and distortion can be easily derived according to the wave aberration. In addition, a photon sieve wave aberration model is built, so that the mixed design of the photon sieve and other optical systems such as a refraction lens is also facilitated.

Description

technical field [0001] The invention relates to a photon sieve aberration analysis method, relates to the technical field of diffractive optical element design, in particular to a secondary grating type photon sieve. Background technique [0002] Traditional lenses are all made of glass, and the light passes through the lens in the form of refraction or reflection to produce the effect of convergence or divergence. Such lenses are collectively called refraction lenses. Different from the traditional refractive lens, the diffractive optical element converges and diverges the light through diffraction, which is called diffractive lens. [0003] Photon sieve is a new type of diffractive optical element, which was proposed by Professor Kipp from Germany on the basis of the traditional zone plate. It replaces the bright ring of the zone plate with a large number of randomly distributed small holes distributed on the bright ring of the zone plate. The light passes through the sma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/42G02B27/00
CPCG02B27/0037G02B27/4216
Inventor 成雪清周鹏云陈雅丽唐霞梅方艾黎梁军潘科谭依玲
Owner SOUTHWEST RES & DESIGN INST OF CHEM IND
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