Photon sieve aberration analysis method
An analysis method and photon sieve technology, applied in optics, optical components, instruments, etc., can solve the problems that the derivation cannot be carried out, the establishment of the photon sieve transmission function is difficult, and it is not applicable
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[0062] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0063] Any feature disclosed in this specification (including the abstract and drawings), unless specifically stated, can be replaced by other equivalent or similar purpose alternative features. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.
[0064] According to a photon sieve aberration analysis method provided by the present invention, such as figure 1 As shown, starting from the mathematical relationship between the phase of the pupil surface of the photon sieve and the point spread function, the diffraction model of ...
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