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Fast grayscale fringe synthesis method based on focused binary pattern

A synthesis method and pattern technology, applied in the field of fast fringe projection measurement, can solve the problems of non-linear error of projection pattern and slow projection rate, and achieve the effects of simple waveform, reduced projection time, and easy and accurate synthesis

Active Publication Date: 2020-09-01
HEFEI UNIV OF TECH
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AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to propose a fast gray-scale fringe synthesis method based on a focused binary pattern to solve the problems of slow projection rate and non-linear error in the projection pattern existing in the existing fringe projection technical scheme

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  • Fast grayscale fringe synthesis method based on focused binary pattern

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Embodiment Construction

[0012] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings.

[0013] like figure 1 As shown, a fast grayscale fringe synthesis method based on focused binary patterns includes the following steps:

[0014] Encoding a group of binary patterns, which includes n binary patterns, the width of the white area of ​​each binary pattern is X, and the equal distance is increased by 2△x in sequence to form a stepped triangular figure;

[0015] The set of n binary patterns is sequentially projected to the object under test by using a projection device, and the projection time of each binary pattern is t;

[0016] Use the camera to collect the projection patterns of the group of n binary patterns, adjust the exposure time of the camera to n*t, so that the projection patterns of the group of binary patterns are collected within one exposure time period of the camera, and synthesize ...

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Abstract

The invention discloses a rapid gray stripe synthesis method based on a focusing binary pattern. The method comprises the steps of coding a binary pattern group comprising multiple binary patterns, wherein the widths of white areas of the binary patterns are sequentially increased with equal distance, and thus a ladder-shaped triangular pattern; sequentially projecting the binary pattern group toan object under test by using a projection instrument; and collecting projection patterns of the binary pattern group by using a camera, adjusting exposure time of the camera, thus completing collection of the projection patterns of the binary pattern group within one exposure time slot of the camera, and combining the projection patterns into a gray-intensity triangular wave stripe pattern. According to the method provided by the invention, the projection time of the gray pattern synthesized by the binary patterns is great reduced, so that the non-linear error of the stripe generated by a projector is avoided. The triangular wave stripe pattern synthesized by the invention is simple in waveform, easy to accurately synthesize, and beneficial to phase resolving and three-dimensional reconstruction.

Description

technical field [0001] The invention relates to the technical field of fast fringe projection measurement, in particular to a fast grayscale fringe synthesis method based on a focused binary pattern. Background technique [0002] With the development of science and technology and precision manufacturing, especially in the fields of automobile, shipbuilding and aircraft manufacturing, there are more and more inspection tasks involving large quantities and complex shapes of geometric quantities and free-form surfaces. The accuracy and accuracy of three-dimensional shape measurement Speed ​​requirements are getting higher and higher. [0003] The profilometry technology based on structured light projection has attracted much attention due to its advantages of fast computing speed, high resolution, and full-field data acquisition, and has been widely researched and applied. But the profilometry technology based on structured light projection, especially the most popular digital...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 于连栋罗辉鲍文慧陆洋金雪莹赵会宁张进
Owner HEFEI UNIV OF TECH
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