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Arrangement unit, testing system and testing method

一种配置单元、检测系统的技术，应用在自动化测试系统、测量电、测量装置等方向，能够解决检测流程耗时增加、检测装置总空闲时间增加等问题，达到减少生产及时间成本、高效率的效果

Active Publication Date: 2018-11-13
PEGATRON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] This case provides a configuration unit, detection system and detection method to solve the problem that the total idle time of the detection device increases and the time-consuming detection process increases

Method used

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  • Arrangement unit, testing system and testing method
  • Arrangement unit, testing system and testing method
  • Arrangement unit, testing system and testing method

Examples

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Embodiment Construction

[0017] The following will clearly illustrate the spirit of the present disclosure with the accompanying drawings and detailed descriptions. After understanding the embodiments of the present disclosure, any person skilled in the art can make changes and modifications based on the techniques taught in the present disclosure. without departing from the spirit and scope of the present disclosure.

[0018] As used herein, "comprising", "comprising", "having", "comprising" and so on are all open terms, meaning including but not limited to.

[0019] As used herein, "and / or" includes any or all combinations of said things.

[0020] Regarding the terms used herein, unless otherwise specified, generally have the ordinary meanings of each term used in this field, in the disclosed content and in the special content. Certain terms used to describe the present disclosure are discussed below or elsewhere in this specification to provide those skilled in the art with additional guidance in ...

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Abstract

The invention discloses an arrangement unit, a testing system and a testing method. The testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.

Description

technical field [0001] The invention relates to a configuration unit, a detection system and a detection method, in particular to a configuration unit, a detection system and a detection method for detection based on the configuration idle state of a detection device. Background technique [0002] Traditionally, in the process of product production, product testing is often required, and product testing most often uses a one-to-one detection method, that is, one test object is tested by one testing device. When multiple test objects need to pass through multiple When using one kind of testing equipment to test multiple items, for example, the object to be tested is ten mobile phones, and each mobile phone needs to test its communication function, screen function and sound function, then each mobile phone needs to be set in sequence Input communication testing equipment, screen testing equipment and sound testing equipment, each mobile phone is put into various testing equipm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G01R31/01
CPCG06Q10/06312G01R31/01G01R31/2834
Inventor 陈志和李文彬曾国原陈郁婷
Owner PEGATRON
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