Method and device for rapidly measuring flatness of keyboard key caps based on structured light imaging
A technology of structured light imaging and measurement methods, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of high equipment cost and maintenance cost, low detection accuracy, slow detection speed, etc., and solve the problems of physical installation and mobile The effect of error, high detection accuracy, and convenient switching
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[0059] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0060] Such as Figure 1 ~ Figure 4 As shown, the keyboard keycap flatness fast measurement method based on structured light imaging of the present invention, its steps are:
[0061] Step S1: Structured light mode design and projection, to ensure that the structured light generated by the digital projector has a clear light stripe on the upper and lower ends of each keycap surface of the keyboard to be tested;
[0062] Step S2: Multiple cameras collect image sequences; after receiving the detection signal, the cameras collect keyboard image sequences encoded by structured light;
[0063] Step S3: image stitching; stitching the image sequence into a complete full-size keyboard image with high resolution;
[0064] Step S4: Keycap modeling; relying on manual acquisition of the keycap mask and the position information of each keycap in ...
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