LED chip and manufacturing method thereof
A technology of LED chips and manufacturing methods, which is applied to electrical components, circuits, semiconductor devices, etc., can solve problems such as insufficient brightness of light-emitting diodes, and achieve the effects of high production efficiency, convenient operation, and simple manufacturing methods
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Embodiment 1
[0045] In order to better describe the present invention, an embodiment of the present invention provides a method for manufacturing a high-brightness LED, including the following steps:
[0046] 1. On the sapphire substrate 1, a buffer layer 2, an N-type GaN layer 3, a multi-quantum well layer 4, and a P-type GaN layer 5 are sequentially grown on the sapphire substrate 1 by MOCVD, thereby preparing an LED epitaxial wafer ; Wherein, the thickness of the epitaxial layer of the LED epitaxial wafer is 6.5 μm.
[0047] 2. Deposit a layer of SiO on the epitaxial wafer by PECVD 2 film, with a thickness of The pattern (CB pattern) of the current blocking layer is prepared by photolithography etching, and the photoresist is removed to obtain the current blocking layer 6; the current blocking layer is provided with a P-region electrode hole for subsequent formation of a P-type electrode.
[0048] 3. Evaporate a layer of indium tin oxide film (ITO) on the LED epitaxial wafer by sputt...
Embodiment 2
[0055] The embodiment of the present invention provides another method for manufacturing a high-brightness LED chip, including the following steps:
[0056] 1. On the sapphire substrate 1, a buffer layer 2, an N-type GaN layer 3, a multi-quantum well layer 4, and a P-type GaN layer 5 are sequentially grown on the sapphire substrate 1 by MOCVD, thereby preparing an LED epitaxial wafer ; Wherein, the thickness of the epitaxial layer of the LED epitaxial wafer is 6.5 μm.
[0057] 2. Deposit a layer of SiO on the epitaxial wafer by PECVD 2 film, SiO 2 The thickness of the film is The pattern (CB pattern) of the current blocking layer is etched and prepared by photolithography, and the photoresist is removed to obtain the current blocking layer 6 .
[0058] 3. A layer of indium tin oxide thin film (ITO) is vapor-deposited on the epitaxial wafer by sputtering, and as the current spreading layer 7, the thickness of the indium tin oxide thin film is And evaporate a layer of simpl...
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