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An echelle grating attitude adjustment method and calibration device for a spectrometer

A step grating and calibration device technology, which is applied in the direction of measuring devices, color/spectral characteristic measurement, instruments, etc., can solve the problems affecting the overall performance of elemental spectrum analysis instruments, difficulty in ensuring accuracy, and complicated installation and adjustment, so as to reduce the difficulty of design , Strong practicability, accurate calculation effect

Active Publication Date: 2020-12-22
NCS TESTING TECH
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  • Application Information

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Problems solved by technology

However, the above-mentioned methods all have disadvantages such as complex installation and adjustment, difficulty in realization, and difficulty in ensuring accuracy. It is difficult to ensure that the three-dimensional posture of the echelle grating meets the design requirements, which will affect the overall performance of the elemental spectrum analysis instrument.

Method used

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  • An echelle grating attitude adjustment method and calibration device for a spectrometer
  • An echelle grating attitude adjustment method and calibration device for a spectrometer
  • An echelle grating attitude adjustment method and calibration device for a spectrometer

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Embodiment

[0053] Taking the attitude adjustment of an échelle grating spectrometer as an example, the attitude adjustment of the échelle grating of the present invention will be further described in detail. However, this embodiment should not be understood as limiting the protection scope of the present invention. The characteristic wavelengths of mercury lamps are selected but not limited to 313.155 nm, 313.183 nm, 404.656 nm, and 579.066 nm.

[0054] The system parameters of the échelle spectrometer are shown in Table 1, the positions of the characteristic wavelengths of the mercury lamp are shown in Table 2, and the relative intervals of the four characteristic wavelengths of the mercury lamp at the position x in the direction of dispersion of the échelle grating are compared with the theoretical relative intervals The aberration is less than or equal to 1 pixel, which fully meets the test requirements of the échelle spectrometer, indicating that the method of the present invention ca...

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Abstract

The invention belongs to the field of optical splitting systems of spectrometers, and relates to an echelle grating posture adjustment method and a calibration device of a spectrometer. According to the adjustment method, an echelle grating diffraction theory is employed; relative positions of light spot images of a plurality of orders of diffraction of an echelle grating on the echelle grating posture adjustment calibration device are precisely calculated according to particular parameters of an optical splitting module system; corresponding marks are made; accordingly, a three-dimensional posture of the echelle grating is adjusted via a fixing structure of the echelle grating. The calibration device is designed on a basis of the particular parameters of the echelle grating diffraction theory and the optical system, is precise in calculation, easy to realize and high in operability and can precisely achieve posture adjustment of the echelle grating in the spectrometer; in addition, the echelle grating posture adjustment calibration device is high in applicability; when the relevant optical parameters of the optical system are changed, the corresponding positions of light spots ofthe orders of diffraction of the echelle grating are required to be recalculated and redesigned.

Description

technical field [0001] The invention belongs to the field of spectrometer spectroscopic systems, and relates to a method for adjusting the posture of an echelle grating of a spectrometer and a calibration device. Background technique [0002] The échelle spectrometer uses an échelle grating with prism cross dispersion to form a two-dimensional spectrum on the image plane. This structure enables the échelle spectrometer to simultaneously achieve high-resolution and wide-band transient measurement. Echelle spectrometer is widely used in a series of elemental spectral analysis technologies such as atomic emission, atomic absorption or LIBS excitation light source due to its excellent characteristics such as high resolution, small size, and full-spectrum transient direct reading. As the most important spectroscopic element in the spectrometer, the échelle grating is very sensitive to the imaging quality of the system, which directly affects the system performance of the échelle ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01G01N21/27
CPCG01N21/01G01N21/278
Inventor 罗剑秋曹海霞何淼赵英飞夏钟海
Owner NCS TESTING TECH
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