Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wide-measuring-range weak illuminance measuring device

A measuring device, illuminance technology, applied in the direction of measuring device, photometry, optical radiation measurement, etc., to achieve the effects of noise reduction, low price, high sensitivity and signal-to-noise ratio

Inactive Publication Date: 2018-06-05
西安应用光学研究所
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem that the present invention mainly solves is 10 -3 lx~10 -9 lx illuminance measurement problem, especially to solve 10 -7 lx~10 -9 Measurement problem of illuminance of lx

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wide-measuring-range weak illuminance measuring device
  • Wide-measuring-range weak illuminance measuring device
  • Wide-measuring-range weak illuminance measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] Describe the present invention below in conjunction with specific embodiment:

[0024] Such as figure 1 , figure 2 , image 3 As shown, a preferred example of a wide-range weak light intensity measuring device of the present invention includes an optical system 1 , a detector assembly 2 , an amplifier assembly 3 , and a data acquisition assembly 4 . The optical system 1 includes an aperture stop 1-1, a cosine corrector 1-2, and a V(λ) filter 1-3. The precision diaphragm 1-1 is used to shield stray light; the cosine corrector 1-2 is used to realize the cosine relationship between the response photocurrent of the detector and the light incident angle; the detector assembly 2 includes a high voltage system 2-1 and a photomultiplier tube 2 -2. Refrigeration system 2-3. The high-voltage system 2-1 provides 1500V voltage for the photomultiplier tube; the photomultiplier tube 2-2 uses the R1894 photomultiplier tube of Hamamatsu, Japan, and its wavelength range is 300nm to...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Resistanceaaaaaaaaaa
Login to View More

Abstract

The invention provides a wide-measuring-range weak illuminance measuring device which settles a problem of measuring 10<-3>lx to 10<-9>lx illuminance. A photomultiplier is used for directly performingdetection. The response magnitude of detector current is nanoampere grade. Electric refrigeration technology and nanoampere-grade stable-state amplification processing technology of the photomultiplier are adopted in designing. The electric refrigeration technology of the photomultiplier greatly reduces noises of the photomultiplier. The nanoampere-grade stable-state amplification processing technology realizes high sensitivity and high signal-to-noise ratio of the device. Detection to illuminance below 10<-3>lx to 10<-9>lx can be performed. Compared with relatively high price of the weak light luxmeter which detects the 10<-7>lx to 10<-9>lx by means of a photon counter, and the price is commonly tens of thousands yuan or event hundreds of thousands yuan, the price of the weak light luxmeter which is designed by means of the photomultiplier and has a lower detection limit to 10<-9>lx is about 15 thousands yuan. The measuring device breaks a 10<-7>lx detecting limit of the Chinese andforeign weak light luxmeter which is designed through the photomultiplier, and furthermore realizes low price. The wide-measuring-range weak illuminance measuring device can be widely applied to technical fields of micro-light and star light.

Description

technical field [0001] The invention belongs to the technical field of optical testing and measurement, and mainly relates to a steady-state illuminance testing instrument, in particular to an instrument with a detection limit of 10 -9 lx's weak illuminance measurement device. Background technique [0002] Extremely low light intensity measurement has been widely used in technical fields such as fluorescence detection, starlight technology and military night vision reconnaissance. At present, the low-light photometers in China are represented by the low-light photometers developed by the National Defense Science and Technology Industry Optical First-Class Metrology Station, Beijing Institute of Technology, Hangzhou Yuanfang Company and Chengdu Testing Institute. The minimum detection ability is 10 -7 lx. than 10 -7 The weaker illuminance of lx can only be detected by a photon counter, and the illuminance value cannot be detected directly. Contents of the invention [0...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J1/44G01J1/02
Inventor 俞兵陈娟曹锋黎高平吴宝宁李宏光袁良范继红
Owner 西安应用光学研究所
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com