Testing system and method of Nand Flash based on Matlab

A test system and test socket technology, applied in static memory, instruments, etc., can solve problems such as test method dependence, and achieve the effect of cost saving

Inactive Publication Date: 2018-06-01
XIAN KEYWAY TECH
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  • Application Information

AI Technical Summary

Problems solved by technology

Market demand has spawned a large number of flash chip research and development and production companies. In order to ensure that the chips they produce can work reliably for a long time, these companies have done high-speed and detailed tests before their products leave the factory. , their customary test method relies on the evaluation board or test platform provided by the Flash controller manufacturer

Method used

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  • Testing system and method of Nand Flash based on Matlab
  • Testing system and method of Nand Flash based on Matlab

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Embodiment Construction

[0020] The Matlab-based Nand Flash testing system and method of the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0021] Through a computer with a built-in Matlab test module and a general test platform based on FPGA development, the read, write, erase tests and data analysis of various packages and models of Nand Flash are completed, such as figure 1 Shown, the Nand Flash test system based on Matlab of the present invention comprises test board and is arranged on the Matlab test module of computer; Described test board comprises storage module, test socket, FPGA module and communication interface; Described storage module, Both the test socket and the communication interface are connected with the FPGA module; the communication interface is connected with the Matlab test module to complete information interaction. The Nand Flash test system based on Matlab of the present invention takes Xilinx Spartan-6 FP...

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Abstract

The invention discloses a testing system and method of Nand Flash based on Matlab and belongs to the field of memory test. The testing system is characterized by comprising a testing board and a Matlab testing module, wherein the testing board comprises a memory module, a testing base, an FPGA (Field Programmable Gate Array) module and a communication interface; the memory module, the testing baseand the communication interface are respectively connected with the FPGA module; the communication interface is connected with the Matlab testing module. The testing system and method disclosed by the invention have the beneficial effects that reading-writing-erasing test and data analysis of Nand Flash are finished in a visual and controllable manner on a general hardware platform, the testing function also can be extended by self according to the needs, the test of Nand Flash can be finished in a fast-efficient-reliable manner, the future needs of the development of the Nand Flash memory technology are met, and a complete and fast test can be continuously carried out on the Nand Flash with increasing complexity, so that the cost is saved for enterprises.

Description

technical field [0001] The invention belongs to the field of memory testing, in particular to a Matlab-based Nand Flash testing system and method. Background technique [0002] With the rapid development of current storage technology and the rapid expansion of the storage market, the usage of Flash memory is also increasing rapidly. Nand Flash chips have risen rapidly due to their absolute advantages such as large capacity, fast read and write speed, and low price, and have been widely used in mobile storage and big data storage services. Market demand has spawned a large number of flash chip research and development and production companies. In order to ensure that the chips they produce can work reliably for a long time, these companies have done high-speed and detailed tests before their products leave the factory. , their customary test method relies on the evaluation board or test platform provided by the Flash controller manufacturer. In the face of numerous controll...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56G11C2029/5602
Inventor 刘升魏超
Owner XIAN KEYWAY TECH
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