A defocus-based non-uniform correction analysis method for infrared imaging system

Abstract

The invention relates to a non-uniform correction analysis method for an infrared imaging system based on defocusing. By moving a focusing mirror or adding a defocusing lens to change the optical path of the infrared imaging system, the original imaging optical path is defocused and then on the focal plane of the detector. A relatively uniform light intensity distribution is formed, and at the same time, stray light and cold reflection are not introduced into the system during the defocusing process, and finally the infrared imaging system can achieve the purpose of non-uniform correction without a baffle. The analysis method provides three defocus correction methods: focus lens movement correction, insertion lens correction, and combination of focus lens movement and insertion lens, and introduces image plane uniformity, system stray light and narcissus intensity into the analysis of non-uniform correction As an evaluation factor, each evaluation factor can be quantitatively analyzed, which improves the accuracy of the analysis. At the same time, the defocus correction can correct the scene information into the system in practical application, which improves the target discovery and recognition ability of the infrared imaging system.

Description

technical field [0001] The invention belongs to the field of optical simulation, and relates to a non-uniform correction analysis method for an infrared imaging system based on defocus. Background technique [0002] Due to the limitations of the existing manufacturing process level and materials, the response characteristics of each detection unit of the infrared focal plane array are not completely consistent, and it is superimposed on the image in the form of fixed pattern noise, which is the non-uniformity of the infrared focal plane array. It seriously affects the imaging quality of the infrared system, making it difficult to distinguish the target image from the background, which limits the performance of the infrared focal plane array and also limits its military and civilian applications. [0003] In order to solve the above problems, the first is to improve the development and production level of infrared focal plane array devices, and further reduce the non-uniformi...

AI Technical Summary

Problems solved by technology

The most commonly used method is to add a baffle correction mechanism in the design of the infrared imaging system, and use the baffle to cut off the optical path transmission and perform image correction. However, when the infrared system works in a relatively harsh temperature condition, the temperature difference between the baffle and the outside temperature is large , resulting in a large temperature difference between the calibration screen and the actual environment

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