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Method for testing gain efficiency of amplifier by using vector network analyzer

A technology of vector network analysis and amplifier gain, which is applied in the direction of single semiconductor device testing, etc., can solve the problems of high labor cost and low measurement accuracy, and achieve the effect of improving speed, saving labor and measurement cost

Active Publication Date: 2018-04-06
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the problems of low measurement accuracy and high labor cost in existing amplifier gain efficiency tests, the present invention provides a method for testing amplifier gain efficiency using a vector network analyzer

Method used

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  • Method for testing gain efficiency of amplifier by using vector network analyzer
  • Method for testing gain efficiency of amplifier by using vector network analyzer
  • Method for testing gain efficiency of amplifier by using vector network analyzer

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Embodiment Construction

[0043] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0044] to combine Figure 1 to Figure 4 , a method for testing amplifier gain efficiency using a vector network analyzer, characterized in that it includes a vector network analyzer 1, a test accessory 2, a DC power supply, and an amplifier under test 3, wherein the test accessory 2 includes a first resistor R0, the second One side of a resistor is connected with the second resistor R2, the third resistor R3 and the fourth resistor R4 in series in sequence, and the other side of the first resistor R0 is connected with the fifth resistor R5, the sixth resistor R6 and the seventh resistor in series in sequence. The resistor R7, the fourth resistor R4 and the seventh resistor R7 are all grounded.

[0045] The resistance of the first resistor R0 is 1Ω, the resistance of the second resistor and the fifth resistor are the same, ...

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Abstract

The invention provides a method for testing the gain efficiency of an amplifier by using a vector network analyzer, including a vector network analyzer, a test accessory, a DC power supply and a tested amplifier. The test accessory includes a first resistor. One side of the first resistor is connected with a second resistor, a third resistor and a fourth resistor which are sequentially connected in series. The other side of the first resistor is connected with a fifth resistor, a sixth resistor and a seventh resistor which are sequentially connected in series. After the vector network analyzeris calibrated, the gain efficiency of the amplifier is measured by using the vector network analyzer. The gain efficiency of the amplifier can be measured through frequency scanning, and the gain efficiency of the amplifier can be measured through power scanning. Finally, the measurement result of gain efficiency can be visually displayed to users through a trajectory curve. The method increasesthe speed of amplifier gain efficiency measurement, and saves the labor and measurement costs.

Description

technical field [0001] The invention relates to the field of amplifier gain efficiency testing, in particular to a method for testing amplifier gain efficiency by using a vector network analyzer. Background technique [0002] Power amplifiers are widely used in microwave, millimeter wave communications, satellite systems, radar, electronic countermeasures, missile guidance, remote control, telemetry and other systems, and become an indispensable device. The working characteristics of microwave power amplifier will directly affect the overall performance index of the system where it is located. Therefore, it is very necessary to measure its performance parameters before use. As a measuring instrument in the field of microwave and millimeter wave scientific research and production, the vector network analyzer is widely used in the measurement of amplifier parameters. For example, a vector network analyzer can be used for amplifier gain compression measurement, intermodulatio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/26
Inventor 李明太刘丹杨明飞袁国平李树彪赵立军庄志远蔡洪坤安洋
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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