Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Semiconductor device with stacked layout

A technology for semiconductors and devices, applied in the field of semiconductor devices, can solve problems such as increasing difficulty, and achieve the effects of simplifying electrical connections and simplifying channel doping

Pending Publication Date: 2017-12-19
INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW) +1
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, continued scaling increases the difficulty of manufacturing and / or meeting desired performance and / or energy consumption criteria

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device with stacked layout
  • Semiconductor device with stacked layout
  • Semiconductor device with stacked layout

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0059] Detailed embodiments of the inventive concept will now be described with reference to the accompanying drawings. However, inventive concepts may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; Those skilled in the art convey the scope of the inventive concept.

[0060] The scalability of thin body devices (eg, fin transistors at the 5nm node and beyond) continues to pose challenges to maintaining acceptable performance parameters such as subthreshold slope (SS) and short channel effects (SCE). Gate-all-around (GAA) nanowire transistors (LFETs) can provide superior control of the gate over a fully depleted channel and allow the gate length to be further scaled by nanowires (NW) with a diameter of 4-7 nm. Scaled to 15nm. However, in conventional 2D layouts, gate length, sidewall spacers, and source / drain contacts compete for space within the pitch of the device. Additionally, ultrathin channels may also po...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The disclosed technology generally relates to semiconductor devices, and more particularly to semiconductor devices having a stacked arrangement, and further relates to methods of fabricating such devices. In one aspect, a semiconductor device comprises a first memory device and a second memory device formed over a substrate and at least partly stacked in a vertical direction. Each of the first and second memory devices has a plurality of vertical transistors, wherein each vertical transistor has a vertical channel extending in the vertical direction.

Description

[0001] Cross References to Related Applications [0002] This application claims foreign priority from European Application No. 16174252.3 filed on June 13, 2016, the content of which is hereby incorporated by reference in its entirety. [0003] background technical field [0004] The disclosed technology relates generally to semiconductor devices, and more particularly to semiconductor devices having stacked arrangements, and also to methods of fabricating such devices. Background technique [0005] The demand for reduced device footprint per memory cell or bit in memory devices and for increased circuit density continues to demand reductions in the gate lengths of transistors of memory devices. Scaling of memory cells also continues to require reduced routing pitch and increased number of lithographic exposures to meet design constraints. However, continued scaling increases the difficulty of manufacturing and / or the difficulty of meeting desired performance and / or energ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L27/11H01L21/8244
CPCH10B10/12B82Y10/00H01L29/66439H01L29/66666H01L29/775H01L27/0688H01L29/78642H01L29/0676H01L29/42392H01L29/7869H01L29/41733
Inventor T·胡耶恩 鲍A·维洛索J·雷恰特
Owner INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products