Hall product testing mechanism and assembling and testing method

Abstract

The invention belongs to the technical field of chip testing and discloses a Hall product testing mechanism and an assembling and testing method. The Hall product testing mechanism comprises a Hall movable clamp, a Hall coil, a collar, a base and a Hall test piece. The Hall coil comprises an I-shaped support and an enameled wire coil which coats the middle of the I-shaped support, one end of the I-shaped support is provided with an annular plate with a round groove in the center, and the center of the round groove is provided with a round through hole. The base is circular and embedded into the round groove, and the Hall test piece is fixed to the upper surface of the base. The middle of the collar is provided with a square hole which annularly sleeves the top end of the Hall movable clamp, and the tail end of the Hall movable clamp is inserted into the round through hole. The whole mechanism forms a positioning and fixing device of the Hall test piece and the Hall movable clamp. By the Hall product testing mechanism and the assembling and testing method, the problem of large difference between maximum and minimum values of measured Gaussian quantity due to magnetic field instability of the Hall coil in a test area in a chip testing process is solved.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a Hall product testing mechanism and an assembly and testing method. Background technique [0002] At present, in the semiconductor integrated circuit manufacturing process, it is necessary to further test the finished chips after cutting and packaging. During the testing process, the Hall coil plays the role of providing a magnetic field. The Hall device test fixture is a fixture used to test the finished Hall device. During the test process, the specific method is to transfer the Hall device to the test clip through the suction nozzle of the chip sorter. After the test is completed, the suction nozzle of the chip sorter will transfer the Hall device to the next process, and the packaging The pins of the body are arranged symmetrically on the left and right. How to ensure the contact between the pins on both sides and the Hall test piece during the test and how to prevent ...

AI Technical Summary

Problems solved by technology

[0007] In the process of testing finished chips in the prior art, the magnetic field of the Hall coil in the test area is not stable enough, the difference between the maximum and minimum Gauss values ​​measured is very large, and the package is shifted left and right in the test clip during the package test, resulting in inaccurate positioning. Accuracy, and after the test is completed, the package is easy to stack in the test station and transferred to the sub-panel. The present invention provides a Hall product testing mechanism and an assembly and testing method.

It achieves the purpose of providing a stable magnetic field by ingeniously designing the counterbore to accommodate the Hall test piece at one end of the Hall coil, and the test clamp of the present invention can be adaptively adjusted according to the size of the package to achieve the purpose of accurate positioning , after adjusting the positioning of the package, it also solves the problem of easy stacking of materials transferred to the sub-panel after the test is completed

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