Circuit measurement calibration method and calibration device of three-dimensional photoelectric vibration measuring instrument
A technology of vibration measurement and calibration method, which is applied in the direction of measuring devices, measuring ultrasonic/sonic/infrasonic waves, instruments, etc., to achieve the effect of efficient measurement
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Embodiment 1
[0028] The phase shift characteristic is a comparative quantity. In order to realize the measurement of the phase shift between the response signal of the laser vibrometer and the initial sinusoidal modulation signal, it is necessary to realize the synchronous acquisition of two channels of the same frequency signal, and to exclude other factors such as inconsistency in signal amplitude. Impact. The spectrum analysis method is used to measure the phase shift characteristics, and the whole cycle sampling is used to reduce the error caused by the spectrum leakage.
[0029] The spectrum analysis method uses discrete Fourier transform (DFT) to analyze the spectrum of the two signals under test to obtain their phase-frequency characteristics. The phase difference between the two signals at the fundamental frequency is the phase shift value. Any absolutely integrable periodic signal x(t) can be expanded into a Fourier series in the finite interval [t,t+T]
[0030]
[0031] In fo...
Embodiment 2
[0047] In this embodiment, the electrical signal calibration method is used to calibrate the rise time of the laser vibrometer, that is, the FM signal excitation whose modulation law is a square wave is input at the input end of its signal acquisition and processing circuit, and the response to the key circuit of the laser vibrometer is The square wave signal is collected and analyzed to obtain its rise time characteristics.
[0048] The square wave signal output by the laser vibrometer is not an ideal square wave signal, but has certain overshoot and zero point oscillation. To achieve accurate measurement of rise time, the steady-state position of the square wave signal waveform must first be accurately located. In order to eliminate the influence of waveform rising overshoot and oscillation, this embodiment uses the mode method to accurately obtain the top value x of the square wave curve T and base value x B .
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