Method for thermal annealing and semiconductor device formed by method

A technology of semiconductors and power semiconductors, applied in the fields of semiconductor devices, semiconductor/solid-state device manufacturing, chemical instruments and methods, etc., which can solve problems such as processing faults and limiting processing scope

Inactive Publication Date: 2017-09-22
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This can lead to treatment failures or limit the scope of treatments such as heat treatment

Method used

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  • Method for thermal annealing and semiconductor device formed by method
  • Method for thermal annealing and semiconductor device formed by method
  • Method for thermal annealing and semiconductor device formed by method

Examples

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Embodiment approach

[0207] According to various embodiments, a method may include: disposing a dopant in a semiconductor region (for example, through the surface of the semiconductor region); on at least a portion of the semiconductor region (for example, on one or more portions of the semiconductor region) On or on the entire semiconductor region) forming at least one allotrope including carbon or a radiation absorbing layer formed of at least one allotrope of carbon; and irradiating the radiation absorbing layer at least partially by using electromagnetic radiation to at least partially The semiconductor region is heated to at least partially activate the dopant.

[0208] According to various embodiments of the present invention, a method may include: arranging a dopant in the semiconductor region on a first side of the semiconductor region; forming on at least a part of the semiconductor region on the first side of the semiconductor region A radiation absorbing layer; at least partially activatin...

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Abstract

According to various embodiments, a method may include: disposing a dopant in a semiconductor region; forming a radiation absorption layer including or formed from at least one allotrope of carbon over at least a portion of the semiconductor region; and activating the dopant at least partially by irradiating the radiation absorption layer at least partially with electromagnetic radiation to heat the semiconductor region at least partially.

Description

Technical field [0001] Various embodiments generally relate to methods for thermal annealing and semiconductor devices formed by the methods. Background technique [0002] Generally speaking, semiconductor materials can be processed with semiconductor technology on or in a substrate (also called a wafer or carrier), for example, to manufacture an integrated circuit (also called a chip). During the processing of the semiconductor material, certain processing steps may be applied, such as thinning the substrate, doping the semiconductor material, or forming one or more layers on the substrate. [0003] In order to dope the semiconductor material, dopants may be injected into the semiconductor material. The semiconductor material can be further processed to fully activate the dopant. Dopant activation can provide the desired electron effect from the dopant in the semiconductor material. In order to activate the dopant, heat energy can be transferred to the semiconductor material af...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/268H01L21/324H01L29/06H01L29/66H01L29/78
CPCH01L21/268H01L21/324H01L29/0657H01L29/0692H01L29/66666H01L29/7827H01L21/223H01L21/225C01B2202/22
Inventor 曼弗雷德·恩格尔哈特
Owner INFINEON TECH AG
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