Chip performance test method, device and system

Abstract

The invention discloses a chip performance test method, device and system. The method comprises that when a test instruction to test a test chip is received, a signal generating unit generates a test signal of the specified type according to the test instruction and outputs the test signal, and a signal connection unit forms a closed loop of a signal receiving and processing unit to which the test signal is input by the opening and closing state of a switch assembly according to test content, and when the signal receiving and processing unit receives the test signal inputted from the closed loop, the test signal is processed to obtain result data, and the result data are compared with preset decision data to obtain a test result corresponding to the test content. The chip performance test can be achieved inside the chip to be tested, the accuracy of the test result is improved, and the test cost is lowered.

Description

technical field [0001] The invention belongs to the field of electronic technology, and in particular relates to a chip performance testing method, device and system. Background technique [0002] At present, capacitive touch chips generally need to test part of the performance of the chip by connecting specific circuits or testing instruments, see figure 1 , figure 1 It is a schematic diagram of a test method for testing the performance of a capacitive touch chip in the prior art. The capacitive touch chip to be tested is provided with a signal generating unit and a signal receiving and processing unit, which are respectively connected to the test circuit or test equipment outside the chip to be tested. The signal generating unit sends a test signal, and the test signal passes through the signal transmission channel. After entering the test circuit or test equipment, after the test is completed, the signal enters the signal reception processing unit through the signal rec...

AI Technical Summary

Problems solved by technology

The capacitive touch chip to be tested is provided with a signal generating unit and a signal receiving and processing unit, which are respectively connected to the test circuit or test equipment outside the chip to be tested. The signal generating unit sends a test signal, and the test signal passes through the signal transmission channel. After entering the test circuit or test equipment, after the test is completed, the signal enters the signal reception processing unit through the signal receiving channel from the test circuit or test equipment, and is processed by the signal reception processing unit to obtain the test result of the performance of the chip to be tested. This method is easy to cause the test results to be disturbed by the external environment, and the complex external circuit will increase the test cost

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