Zero-ohm resistance-based high-reliability LED (Light Emitting Diode) lamp bead

A technology of LED lamp beads and ohmic resistors, applied in circuits, electrical components, electric solid devices, etc., can solve the problems of damaged lamp quality, current aging, weakened luminous intensity, etc. The effect of service life

Pending Publication Date: 2017-06-13
南京养元素电子科技有限公司 +1
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Generally, lamps and lanterns have a large number of LED light-emitting units involved. These units are connected in series or parallel. The problem is that if one of the parallel lamp beads is damaged by a short circuit, the entire parallel lamp group will not light up. If an open circuit is damaged, it will also cause the entire series light group to be off
According to the calculation of reliability theory, even if the MTBF (mean time between failure) of a single LED lamp bead is as long as several decades, and a lamp composed of hundreds of lamp beads, as long as one lamp bead is damaged, it will fail, and its lamp The MTBF is only a few months. In addition, the voltage of the lamp beads connected in parallel is the same, but the forward voltage of each lamp bead is not the same. A small voltage difference will cause a large difference in current, and a large current will accelerate aging. The small luminous intensity is weakened, resulting in dark areas, and also seriously damages the quality of lamps

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Zero-ohm resistance-based high-reliability LED (Light Emitting Diode) lamp bead
  • Zero-ohm resistance-based high-reliability LED (Light Emitting Diode) lamp bead
  • Zero-ohm resistance-based high-reliability LED (Light Emitting Diode) lamp bead

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] A high-reliability LED lamp bead based on zero-ohm resistance, such as figure 2 As shown, it includes 6 light-emitting units connected in parallel, each light-emitting unit includes an LED chip and a zero-ohm resistor, and the LED chip and the zero-ohm resistor are connected in series with gold wires. Gold wires are used to connect the positive electrode of the light-emitting unit to the P-type electrode of the LED chip, between the N-type electrode of the LED chip and the zero-ohm resistor, and between the zero-ohm resistor and the negative electrode of the light-emitting unit. If an LED chip in the lamp bead fails and short-circuits, all the current of the lamp bead will flow into the failed LED chip, and the current is far greater than the rated current of the LED chip. At this time, the current flowing through the light-emitting unit will It will burn off the zero-ohm resistor or gold wire connected in series with the LED chip, making the light-emitting unit form a...

Embodiment 2

[0026] A high-reliability LED lamp bead based on zero-ohm resistance, such as image 3 As shown, it includes 12 light-emitting units. The above-mentioned 12 light-emitting units are divided into two light-emitting groups. Each light-emitting group includes 6 light-emitting units. The 6 light-emitting units in the light-emitting group are connected in parallel, and then the light-emitting groups are connected in parallel. . Wherein, each light-emitting unit includes an LED chip and a zero-ohm resistor, and the LED chip and the zero-ohm resistor are connected in series with gold wires. Gold wires are used to connect the positive electrode of the light-emitting unit to the P-type electrode of the LED chip, between the N-type electrode of the LED chip and the zero-ohm resistor, and between the zero-ohm resistor and the negative electrode of the light-emitting unit. Dividing the 12 light-emitting units into two light-emitting groups and then connecting them in parallel can effecti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a high-reliability LED (Light Emitting Diode) lamp bead, which comprises a plurality of light emitting units connected in parallel, wherein each light emitting unit comprises series-connected LED chips and zero-ohm resistances. The overall light emitting effect of the LED lamp bead cannot be affected even if the individual LED chip fails to cause a short circuit, and the zero-ohm resistances are burned out to form an open circuit, so that the service reliability and quality index of the LED lamp bead are improved, and the service life of the LED lamp bead is prolonged.

Description

technical field [0001] The invention belongs to the technical field of LEDs, in particular to a high-reliability LED lamp bead based on zero-ohm resistance. Background technique [0002] It is generally believed that the lifespan of LED lamp beads is as long as several decades, but in fact the reliability after being made into lamps is not as good as expected, which is closely related to the structure and process of LED lamps. Generally, a large number of LED light-emitting units are involved in lamps and lanterns. These units are connected in series or parallel. If an open circuit is damaged, the entire series-connected lamp group will not light up. According to the calculation of reliability theory, even if the MTBF (mean time between failure) of a single LED lamp bead is as long as several decades, and a lamp composed of hundreds of lamp beads, as long as one lamp bead is damaged, it will fail, and its lamp The MTBF is only a few months. In addition, the voltage of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L25/075
CPCH01L25/0753
Inventor 谢东藩李娜唐鹏程
Owner 南京养元素电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap