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Device and method for testing resolution of reflector

A mirror and resolution technology, applied in the field of optical testing, can solve the problem of not finding the testing method

Active Publication Date: 2017-05-31
中航洛阳光电技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

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  • Device and method for testing resolution of reflector
  • Device and method for testing resolution of reflector

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Embodiment Construction

[0020] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described:

[0021] The specific test method and process are as follows:

[0022] 1) Put the product under test (mirror 1, mirror 2, mirror 3 and mirror 4) on the electric control turntable and fix the product.

[0023] 2) Start the high and low temperature box, and lower the high and low temperature box to -55°C;

[0024] 3) Simultaneously activate the heating film on the inner surface of the light window on the high and low temperature box to keep the temperature of the inner surface of the light window consistent with the outside temperature of the high and low temperature box.

[0025] 4) Move the standard mirror to the position shown in the figure through the electric control guide rail, and the standard mirror is 45° with the collimator and the front mirror.

[0026] 5) Turn on the collimator light source, the parallel light emitted by the collimator is reflected by t...

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Abstract

The invention relates to a device and method for testing resolution of a reflector. The tested reflector is placed in a high-and-low-temperature box, and is heated or cooled to a target temperature, parallel light which is transmitted by a collimator penetrates through a light window of the high-and-low-temperature box, the measured reflector and an optical window and enters a front mirror, the front mirror is used for observing a resolution ratio target plate image of the collimator, and the resolution ratio of the reflector is measured at different temperatures. In addition, a surface of the optical window is positioned in the high-and-low-temperature box while another surface of the optical window is positioned out of the high-and-low-temperature box, when the high-and-low-temperature box works at different temperatures, the temperatures of the inner surface and the outer surface of the optical window are not consistent, parameter thermal deformation can be caused, measurement precision can be affected, and even the high-and-low-temperature box cannot be used completely. In order to guarantee measurement precision, heating films are plated on the inner surface and the outer surface of the optical window, the temperatures of the two surfaces of the optical window are consistent, and the thermal deformation is eliminated.

Description

technical field [0001] The invention belongs to the technical field of optical testing, and relates to a device and a testing method for testing the resolution of a mirror. Background technique [0002] Reflectors are widely used in airborne optoelectronic products and are relatively important components in optoelectronic products, which have a great impact on the imaging quality of optoelectronic products. At room temperature, the resolution of the reflector needs to be tested after assembly to ensure the assembly effect without affecting the imaging quality of the system. There are mature test methods. The working environment of airborne optoelectronic products is relatively harsh, with a temperature range of -55°C to +70°C. Products are often deformed at high and low temperatures, which affects the resolution of the mirror and reduces the imaging quality of the system. Therefore, it is necessary to test the resolution of the mirror at high and low temperatures. No simil...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/005
Inventor 董续勇赵艳平张华锋周凤利
Owner 中航洛阳光电技术有限公司
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