Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic detection, profiling and sorting method for macroarray resistance strain gages

A resistive strain and automatic detection technology, applied in sorting, measuring devices, instruments, etc., can solve the problems of low production efficiency, large output of strain gauges, and high production costs

Inactive Publication Date: 2017-01-25
SHAANXI UNIV OF TECH
View PDF9 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the trimming is to manually use scissors to trim a single product along the outer frame of the product. This method not only has low production efficiency and high labor intensity, but also has low trimming dimensional accuracy, and there are large fluctuations in the dimensions of the same batch of products. , which is not conducive to the stable control of product quality; the measurement of resistance and voltage of strain gauges is completely dependent on manual testing. Due to the large output of strain gauges, many workers are required, resulting in high labor intensity, high production costs, low test efficiency, and error-prone , It is also not conducive to the stability control of product quality; moreover, sorting is also manual sorting. The manual sorting method not only has low production efficiency, high labor intensity, high production cost, and is prone to errors, it is also not conducive to product quality. stability control

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic detection, profiling and sorting method for macroarray resistance strain gages
  • Automatic detection, profiling and sorting method for macroarray resistance strain gages
  • Automatic detection, profiling and sorting method for macroarray resistance strain gages

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0108] Such as figure 1 and Figure 20 As shown, the large array resistive strain gauge automatic detection, modification and sorting device of the present invention includes an automatic detection device 1, an automatic modification device 2, an automatic sorting device 3 and a computer 4, and the automatic detection device 1 includes Detection frame, detection positioning fixing mechanism and detection mechanism, described automatic shape modification device 2 comprises shape modification frame, shape modification positioning fixing mechanism and shape modification mechanism, and described automatic sorting device 3 comprises sorting frame, sorting Positioning and fixing mechanism, adsorption sorting mechanism and positioning and sorting mechanism, the computer 4 is connected with a data acquisition board 10 and a desktop digital multimeter 37, and the signal output terminal of the data acquisition board 10 is connected with an output amplifier 11;

[0109] combine figur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an automatic detection, profiling and sorting method for macroarray resistance strain gages; devices used in the method include an automatic detection device, an automatic profiling device, an automatic sorting device, a computer data collection card, a bench type digital multimeter, and an output amplifying board; the automatic detection device comprises a detection frame, a detection positioning and fixing mechanism and a detection mechanism; the automatic profiling device comprises a profiling frame, a profiling positioning and fixing mechanism, and a profiling mechanism; the automatic sorting device comprises a sorting frame, a sorting positioning and fixing mechanism, a suction sorting mechanism and a positioning sorting mechanism; the method includes the steps of first, automatically detecting macroarray resistance strain gages; second, automatically profiling the macroarray resistance strain gages; third, automatically sorting the macroarray resistance strain gages. The method enables production efficiency to be improved, and labor intensity of workers and production cost to be reduced.

Description

[0001] The patent application of the present invention is a divisional application of the invention patent application with the application date of December 31, 2015, the application number 201511030159.9, and the invention name is "Large Array Resistive Strain Gauge Automatic Detection, Modification, Sorting Device and Method". technical field [0002] The invention belongs to the technical field of resistance strain gauge production, and in particular relates to a method for automatic detection, shape modification and sorting of large array resistance strain gauges. Background technique [0003] Resistive strain gauge is the key component of experimental stress analysis, test measurement technology, automatic detection and control technology, and weighing or force sensor. It has small size, small creep, good fatigue resistance and good stability, etc. It is widely used in the diagnosis and evaluation of the strength and life of various mechanical and engineering structures,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/344B07C5/02B07C5/36B07C5/38B26D1/18B26D5/26B26D7/02G01D21/02
CPCB07C5/344B07C5/02B07C5/362B07C5/363B07C5/38B26D1/185B26D5/26B26D7/025G01D21/02
Inventor 秦伟
Owner SHAANXI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products