A scanning electron microscope sample infection device
A scanning electron microscope and sample technology, which is applied in the preparation of test samples, circuits, discharge tubes, etc., can solve problems such as solution volatilization failure, sample easy to fall off, and affect the accuracy of experimental results, etc., to increase conductivity and secondary electrons Yield, reduced impact on human body and environment, clear and visible sample structure
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[0028] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.
[0029] A scanning electron microscope sample infection device of the present invention such as figure 1 As shown, a scanning electron microscope sample infection device is composed of an outer cylindrical tube 1, a screen set 2, a sealed inner cover 3 and a sealed outer cover 4, forming a closed and cooperative device.
[0030] 1. The structure of each part
[0031] The bottom end of the outer cylindrical tube 1 is closed, and the upper end is open to form a cylindrical lumen, and a positioning ring 6 protruding from the tube wall and a positioning member inlet 7 located on the positioning ring are arranged on the upper middle of the outer wall.
[0032] The sieve set 2 is a cylindrical sieve-like lumen structure with an upper opening of the outer flange 5 of the sieve set, and its lumen is smaller than that of the outer cylindrical ...
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