Satellite element service life evaluation method based on aging test data before assembly

Abstract

The invention relates to a satellite element service life evaluation method based on aging test data before assembly. The method comprises the steps: starting with a failure mode and a failure mechanism in the actual application process of a satellite element through an accelerated degradation test theory model and combining with a space application environment, and building the degradation tracks of all electrical performances in the high-temperature aging test data; calculating the failure pseudo service lives of all electrical parameters through combining with the degradation tracks and failure threshold values of all electrical parameters; calculating the service life distribution of the element under high-temperature strain through the fitting pseudo service life distribution and multi-parameter pseudo service life distribution fusion; and finally carrying out the calculation of the service life of the element under the normal strain through determining an acceleration factor. The method belongs to the technical field of element reliability and service life evaluation.

Description

(1) Technical field: [0001] The invention relates to a method for evaluating the service life of satellite components based on aging test data before installation. It is based on the theoretical model of accelerated degradation test, combined with the aerospace environment, starting from the failure mode and failure mechanism of satellite components in the actual use process, and establishes the degradation trajectory of each electrical performance parameter in the high-temperature aging test data. After that, combined with the degradation trajectory and failure threshold of each electrical performance parameter, the failure pseudo-life of each electrical performance parameter is calculated. Furthermore, by fitting pseudo-lifetime distribution and multi-parameter pseudo-lifetime distribution fusion, the lifetime distribution of components under high temperature stress can be calculated. Finally, the life of the device under normal stress is calculated by determining the accel...

AI Technical Summary

Problems solved by technology

With the development of science and technology, especially the development process of Moore's law of electronic devices, the update of the traditional reliability prediction model is seriously behind, and its reliability prediction results are no longer accurate

The life evaluation method based on the failure physical model cannot predict the on-site reliability of the installed components; at the same time, it needs complex knowledge of materials, structure, failure mechanism, etc.; and the implementation is expensive and difficult

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