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Silicon chip electron life tester positioning device

A technology of minority lifetime and positioning device, which is applied in the direction of measuring device, electronic circuit test, single semiconductor device test, etc., can solve the problems of silicon chip test failure, etc., and achieve the effect of avoiding test failure, easy implementation, and simple structure

Inactive Publication Date: 2016-11-16
KONCA SOLAR CELL
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to address the above problems and provide a positioning device for a silicon chip minority carrier life tester to solve the problem that the existing silicon chip minority carrier life tester will fail the test if the silicon chip is placed tilted during the test

Method used

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  • Silicon chip electron life tester positioning device
  • Silicon chip electron life tester positioning device

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Embodiment Construction

[0015] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods. It should be understood that the embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0016] Please refer to figure 1 and figure 2 as shown, figure 1 It is the front view of the positioning device for the silicon chip minority carrier life tester of the present invention; figure 2 It is a side view of the positioning device for the silicon chip minority carrier lifetime tester of the present invention.

[0017] In this embodiment, a positioning device for a silicon wafer minority life tester includes a bottom tray 1, and one side of the bottom tray 1 is provided with a positioning baffle, and the positioning baffle includes a mounting part 2 and a positioning part 3 , the installation part 2 and the positioning part 3 are integrally...

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Abstract

The invention discloses a silicon chip electron life tester positioning device, comprising a bottom pallet; one side of the bottom pallet is provided with a positioning baffle plate; the positioning baffle plate comprises an installation part and a positioning part, wherein the positioning part is arranged at the upper end of the installation part, and the positioning part is provided with a cushioning pad. The silicon chip electron life tester positioning device realizes silicon chip positioning by employing the positioning baffle plate, and can guarantee a silicon chip from inclination, and avoid test failure; the positioning part is provided with the cushioning pad so as to effectively avoid breaking caused by direction collision between the silicon chip and the positioning part; the silicon chip electron life tester positioning device has a simple structure and is easy to realize.

Description

technical field [0001] The invention relates to a positioning device, in particular to a positioning device for a silicon chip minority carrier life tester. Background technique [0002] The minority carrier lifetime tester for silicon wafer is an instrument used to measure the minority carrier lifetime of silicon wafers. The minority carrier lifetime tester for silicon wafers currently used in the market, in the testing process, once the silicon wafer is placed with an inclination, it is easy to cause edge The measurement fails everywhere, so it needs to be solved urgently. Contents of the invention [0003] The purpose of the present invention is to address the above problems and provide a positioning device for a silicon chip minority carrier life tester to solve the problem that the existing silicon chip minority carrier life tester will fail when the silicon chip is placed tilted during the test. [0004] The purpose of the present invention is to realize through the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28G01R35/00
CPCG01R31/2601G01R31/2831G01R35/00
Inventor 王栋姜树华华万峰
Owner KONCA SOLAR CELL
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