Microstrip nanometer film microwave electromagnetic parameter testing apparatus

Abstract

The invention provides a microstrip nanometer film microwave electromagnetic parameter testing apparatus, which belongs to the technical field of electromagnetic parameter testing. The apparatus is provided with a microstrip clamp, a microwave vector network analyzer, a GPIB data acquisition card, and a computer. The microstrip clamp is composed of an L-shaped base, an upper conduction band, an adjustable short circuit piece, an SMA connector, a shield cover and a fixed platform. One end of the L-shaped base is provided with a circular hole; the other a step. The two ends of the adjustable short circuit piece are provided with grooves. The SMA connector is mounted on the L-shaped base and is connected to the coaxial cable of the microwave vector network analyzer; a nanometer film sample is placed at the center position of the input end and the adjustable short circuit piece. The microstrip clamp is fixed on the fixed platform, and the four corners of the fixed platform are equipped with height adjustable supporting rods. The fixed platform is evenly engraved with a set of horizontal lines marked with scales. Two spring clamp sheets are locked on the fixed platform and are placed on the end face and the face of the microstrip clamp respectively. The apparatus can achieve precise measurement, cause no damage and is convenient to operate.

Description

technical field [0001] The invention relates to a detection of electromagnetic parameters of materials, in particular to a microstrip device for testing nano-film microwave electromagnetic parameters. Background technique [0002] With the rapid development of electronic information technology, the operating frequency and integration of electronic components continue to increase. As one of the key components of electronic components, electromagnetic components must develop in the direction of miniaturization, integration, and high frequency. In recent years, high-frequency electromagnetic thin-film materials have attracted a lot of attention due to their great application potential in the integration and miniaturization of electromagnetic fields, such as thin-film inductors, transformers, and magnetic sensors. Compared with bulk materials, high-frequency electromagnetic thin film materials are more promising as core materials due to their relatively small volume, low coerciv...

AI Technical Summary

Problems solved by technology

Although the resonant cavity method has high test accuracy and simple operation, it can only measure point frequency, and the accuracy and stability of the measurement cannot be guaranteed.

The double-coil method is greatly disturbed by the surrounding electromagnetic field, the error increases, the structure is complex, it is not easy to process, and the sensitivity is low

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