Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

EEMD and rational spline smooth envelope analysis method for rotating machine

A technology of rotating machinery and envelope analysis, which is applied in the field of condition monitoring and fault diagnosis of rotating machinery, and can solve problems such as low technical accuracy, low analysis accuracy, and misjudgment.

Inactive Publication Date: 2016-09-28
WEIFANG UNIVERSITY
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing envelope analysis technology has the following three defects: ① The existing envelope analysis technology either directly analyzes the original signal, or only analyzes the original signal after simple filtering, so the existing method It is easily disturbed by noise, trend and other components, resulting in low analysis accuracy of the existing technology; ②The existing envelope analysis technology is based on the Hilbert transform, and the Hilbert transform requires that the signal to be analyzed must be a single component Narrowband signals, otherwise the frequency modulation part of the signal will pollute the amplitude envelope analysis results of the signal, but the current signals to be analyzed do not strictly meet the conditions of single component and narrowband, which will lead to the existing technology is easy to The problem of misjudgment occurs; ③The envelope spectrum obtained by traditional methods has endpoint effects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • EEMD and rational spline smooth envelope analysis method for rotating machine
  • EEMD and rational spline smooth envelope analysis method for rotating machine
  • EEMD and rational spline smooth envelope analysis method for rotating machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0086] Examples such as figure 1 , figure 2 , image 3 As shown, an envelope analysis method of EEMD and rational spline smoothing for rotating machinery, including the following steps:

[0087] Step 1: Use the acceleration sensor to measure the vibration signal x(k), (k=1, 2,...,N) of the rotating machinery at the sampling frequency fs, where N is the length of the sampling signal;

[0088] Step 2: Use the Ensemble Empirical Mode Decomposition (EEMD) algorithm to decompose the signal x(k) into the sum of n components and a trend item, namely , where c i (k) represents the i-th component obtained by the EEMD algorithm, r n (k) represents the trend item obtained by the EEMD algorithm;

[0089] Step 3: to c i (k) Perform the rearrangement operation and replacement operation, and the data obtained by the rearrangement operation is represented by c i shuffle (k) indicates that the data obtained after the substitution operation is c i FTran (k) means;

[0090] Step 4: ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an EEMD and rational spline smooth envelope analysis method for a rotating machine, and the method comprises the steps: firstly carrying out the decomposition of an original signal through employing an ensemble empirical mode decomposition method; secondly eliminating a noise component and a trend term in a decomposition result through employing the rearrangement and replacement operations of data; thirdly carrying out the analysis of the signal after first filtering through employing a spectral kurtosis method, and obtaining the central frequency and bandwidth of an optimal filter; fourthly carrying out the second filtering of the signal after first filtering through employing the filter; fifthly carrying out the envelope analysis of the signal after second filtering through employing a rational spline iteration smooth envelope analysis method; and finally determining the fault type of the rotating machine according to an envelope spectrum. The method is suitable for the processing of a complex fault signal of the rotating machine, can accurately judge the fault type of the rotating machine, is good in anti-noise performance and robustness, and is convenient for engineering application.

Description

technical field [0001] The invention relates to the field of state monitoring and fault diagnosis of rotating machinery, in particular to an EEMD and rational spline smoothing envelope analysis method of rotating machinery. Background technique [0002] Envelope analysis technique is widely used in fault diagnosis of gears and rolling bearings. The existing envelope analysis technology has the following three defects: ① The existing envelope analysis technology either directly analyzes the original signal, or only analyzes the original signal after simple filtering, so the existing method It is easily disturbed by noise, trend and other components, resulting in low analysis accuracy of the existing technology; ②The existing envelope analysis technology is based on the Hilbert transform, and the Hilbert transform requires that the signal to be analyzed must be a single component Narrowband signals, otherwise the frequency modulation part of the signal will pollute the amplit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01M13/04
CPCG01M13/045
Inventor 窦春红
Owner WEIFANG UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com