Ultrafast X-ray Diffraction Imaging Method and System Based on Flash X-ray Machine

Abstract

The invention provides an ultra-rapid X-ray diffraction imaging method and system based on a flash X-ray machine. The system comprises the flash X-ray machine which comprises a flash X-ray diode and further comprises a diffraction regulation subsystem, a detector subsystem and an auxiliary regulation subsystem. According to the method provided by the invention, a new diffraction light path regulation method is adopted, that is, a direct-current X-ray machine, a diffraction regulation system and a counting type detector are assembled, and after an accurate diffraction angle of anode characteristic line energy of the flash X-ray diode is determined, a plane-array detector is utilized. With the adoption of the method provided by the invention, the problem that a flash X-ray diffraction light path is difficult to regulate can be solved; and meanwhile, the signal-to-noise ratio of a diffraction image can be improved by a determined accurate diffraction angle and the complexity of the system is greatly lowered.

Description

technical field [0001] The invention relates to an ultrafast X-ray diffraction imaging method and system based on a miniaturized flash X-ray machine, which realizes X-ray diffraction imaging on the order of nanoseconds. The method and system relate to the field of shock dynamics and can measure changes in the microstructure of materials on a nanosecond time scale. Background technique [0002] In the study of the shock wave compression properties of materials, the traditional shock wave measurement method cannot give the structural change information at the atomic level, and the elastic-plastic deformation, yield and failure of materials still remain at the macroscopic empirical description level. The currently widely used test methods are all based on macroscopic quantities, and lack real-time microscopic data of the shock wave propagation process. Therefore, the dynamic process can only be reconstructed through macroscopic test methods combined with corresponding theories....

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Problems solved by technology

[0005] In order to solve the problems of large background density and difficult adjustment of diffraction optical path caused by the application of flash X-ray machine in X-ray diffraction imaging technology, the present invention proposes a flash X-ray diffraction optical path adjustment method, and establishes a method based on flash X-ray machine. The ultrafast X-ray diffraction imaging system can be applied to the measurement of material microstructure changes on the nanosecond time scale

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