Optical device measurement method and measurement system based on optical double sideband modulation
A measurement system and double-sideband technology, which is applied in the direction of optical instrument testing, measuring devices, machine/structural component testing, etc., can solve the problems of low measurement efficiency, limited bandwidth, small dynamic range, etc., and achieve wide measurement range and low cost , the effect of large dynamic range
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[0023] Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
[0024] The idea of the present invention is to use the optical double-sideband signal to realize the measurement of the spectral response of the optical device, respectively use the ordinary optical double-sideband signal and the optical Hilbert-transformed optical double-sideband signal to measure the optical device to be measured, and then through data processing, Obtain the amplitude response and phase response of the optical device under test.
[0025] figure 1 It is a schematic diagram of the system structure of the present invention, and the system includes a light source, a microwave frequency sweep source, an optical double sideband modulator, an optical Hilbert converter, a photoelectric detector, a microwave amplitude and phase receiving module, and a control and data processing unit. The optical double sideband modulator modulates the...
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