Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Reliability Evaluation Method for Resource Constrained Multi-Node Computing System

A technology of resource constraints and computing systems, applied in the computer field, can solve problems such as storage difficulties, low computing efficiency, and reducing storage space requirements, and achieve the effects of high computing efficiency, improving computing efficiency, and reducing storage space requirements.

Active Publication Date: 2021-03-26
ZHEJIANG NORMAL UNIVERSITY
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problems of too many states, difficult storage, and low calculation efficiency in the state enumeration of the communication resource-constrained multi-node computing system in the prior art, and to use a more efficient decision-making graph The computing data structure efficiently encodes the working status of the communication resource-constrained multi-node computing system, thereby greatly reducing the storage space requirement and improving computing efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Reliability Evaluation Method for Resource Constrained Multi-Node Computing System
  • A Reliability Evaluation Method for Resource Constrained Multi-Node Computing System
  • A Reliability Evaluation Method for Resource Constrained Multi-Node Computing System

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0077] Step 1: Establish a basic BDD model computer cluster organization, and encode a single server or computing core in each operation or working node (1) in the BDD model computer cluster organization and the state of its running components according to Boolean variables (2 ), a single server or computing core and its operating parts are collectively referred to as nodes hereinafter; all operating state forms of nodes are coded as X, and when X node is in working state, it is code 1, and the state indicates X=1; when X node is Code 0 in the fault state, the status indicates X=0; and the connection state code of X=1 is 1, and the connection state code of X=0 is 0; the node accepts the operation data from each subordinate or peer node, and sets the model diagram as shown in 1.

[0078] And set the occurrence probability P of the running state when the data is received in branch (3) 0 and 1, the probability P comes from the node manufacturer's manufacturing data, detection dat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention belongs to the field of computer technology, and the present invention is realized through the following technical solutions: a method for evaluating the reliability of a resource-constrained multi-node computing system, the steps are as follows: Step 1: establish a basic BDD model computer cluster organization, and perform BDD Each node in the model computer cluster organization is coded according to Boolean variables. Step 2: Continue to use the BDD model to encode the system-level state of the BDD model computer cluster organization, and each node in the BDD model computer cluster organization is in space according to The X-axis and Y-axis are arranged and numbered to coordinate the horizontal and vertical axes of the position plane in the system-level BDD model. Step 3. After the coordinates are arranged in step 2, the node work (quantity) status requirements organized by the BDD model computer cluster, Set the node to start the work, step 4: After obtaining the BDD model computer cluster organization constructed in step 3, use the system-level BDD model to evaluate the reliability of the obtained BDD model computer cluster organization.

Description

technical field [0001] The invention belongs to the technical field of computers and relates to a method for evaluating the reliability of a resource-constrained multi-node computing system. Background technique [0002] With the development of economy and society, people's demands on the processing capacity of computing systems continue to increase. In recent years, the multi-node computing system that has emerged in the mountains provides powerful computing capabilities through parallel computing of multiple independent computing nodes. There are two types of typical multi-node computing systems, 1) cluster computing system: the cluster computing system is composed of multiple server nodes through the Internet, and provides services as a virtual high-performance server under the management of the cluster management software ; 2) Multi-core processor: A multi-core processor is designed with multiple computing cores and an interconnection network inside the chip. At this ti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F15/177G06F15/173
Inventor 莫毓昌
Owner ZHEJIANG NORMAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products