Preparation method of polyolefin nanocomposite dielectric material SEM analysis sample

Abstract

The invention discloses a preparation method of a polyolefin nanometer electric composite dielectric material SEM analysis sample, and belongs to the field of surface topography analysis. The technical problems that when an SEM is used for observing a microstructure of a polyolefin nanometer electric composite dielectric material, due to the fact that a sample is not level or smooth enough, the non-level and unsmooth information affects people obtaining images, the true circumstance of surface information cannot be well represented, and even nanometer particles on the surface of the polyolefin nanometer electric composite dielectric material cannot be recognized are solved. The method comprises the steps that 1, the polyolefin nanometer electric composite dielectric material is dried; 2, the dried polyolefin nanometer electric composite dielectric material is placed on a press vulcanizer to be pressed into a sheet and sheared to obtain a sheet sample; 3, an assembly to be pressed is assembled; 4, the assembly to be pressed is placed in the press vulcanizer to be pressed for the second time, a heating power source of the press vulcanizer is turned off, the product is naturally cooled along with the press vulcanizer, and the product is taken out of the press vulcanizer to be stored. The sample is used for SEM analysis of the polyolefin nanometer electric composite dielectric material.

Description

technical field [0001] The invention belongs to the field of surface morphology analysis, in particular to a method for preparing a polyolefin nanocomposite dielectric material SEM analysis sample. Background technique [0002] Because filling nanomaterials can improve some basic properties of dielectric materials, polyolefin nanocomposite dielectric materials have gradually become a research hotspot in the field of dielectrics. Because ordinary optical microscopes cannot observe fillers with a scale of nanometers, scanning electron microscopes have become It is an essential means to characterize the morphology of dielectric nanocomposites. [0003] The basic principle of the scanning electron microscope is: under the action of accelerating high voltage, the electrons emitted by the electron gun are collected into a small (generally 1-5nm in diameter) electron beam (the corresponding beam current is 10 nm) through a multi-stage electromagnetic lens. -11 ~10 -12 A). Under ...

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Problems solved by technology

[0005] The invention solves the problem that when using SEM to observe the microstructure of the polyolefin nanocomposite dielectric material, because the sample is not flat enough, the information on the unevenness affects us to obtain the image, and the real situation of the surface information cannot be well characterized, and even cannot The technical problem of distinguishing the nanoparticles on the surface of the polyolefin nanocomposite dielectric material; and the preparation method of the SEM analysis sample of the polyolefin nanocomposite dielectric material

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