Preparation method of water-oxygen barrier layer
A technology of water-oxygen barrier layer and barrier layer, which is applied in semiconductor/solid-state device manufacturing, electrical components, electric solid-state devices, etc., can solve problems such as unfavorable industrialization development, increased cost of OLED device preparation, and increased difficulty in film preparation. Reduce the water oxygen transmission rate, improve the barrier effect, and have a wide range of applications
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Embodiment 1
[0036] In this example, see Figure 1~3 , a method for preparing a water-oxygen barrier layer, adopting a magnetron sputtering method to sequentially sputter metal Al on a PI flexible substrate to prepare two layers of barrier material film layers to form a water-oxygen composite double-layer mismatch barrier layer. In the preparation process of the barrier material film layer, the first layer of barrier material film layer is prepared using the first set of parameters, and the second layer of barrier material film layer changes some parameters that affect the properties and structure of the film layer, and continues to deposit, thus preparing A double-mismatched barrier layer was created.
[0037] In this embodiment, the substrate is a PI flexible substrate, and the sputtering material is pure Al. The specific method for preparing the double-layer mismatched barrier layer is as follows: first clean the PI flexible substrate, and then heat the PI flexible substrate on the subs...
Embodiment 2
[0040] This embodiment is basically the same as Embodiment 1, especially in that:
[0041] In this example, see Figure 4 and Figure 5 , using the magnetron sputtering method to sequentially use three different parameters to sputter metal Al on the PI flexible substrate to prepare three layers of barrier material film layers to form a water-oxygen composite multilayer mismatch barrier layer. In the preparation process of the barrier material film layer, the first layer of barrier material film layer is prepared using the first set of parameters, and the second layer of barrier material film layer changes some parameters that affect the properties and structure of the film layer, and continues to deposit; the third layer The barrier material film layer changes some parameters that affect the properties and structure of the film layer, and continues to deposit, thus preparing a three-layer mismatched barrier layer;
[0042] In this embodiment, the substrate is a PI flexible s...
Embodiment 3
[0044] This embodiment is basically the same as the previous embodiment, and the special features are:
[0045] In this example, see Figure 6 , a method for preparing a water-oxygen barrier layer, using atomic layer deposition method, sequentially depositing Al on a PI flexible substrate 2 o 3 A multi-layer barrier material film layer is prepared to form a water-oxygen composite multi-layer mismatch barrier layer. This example is an expansion of the mismatch method in the preparation of barrier films, without destroying the vacuum environment. When changing the special parameters such as the reaction gas flow ratio and the type of precursor, the type of the product is not changed, but the product is significantly changed. The structural properties of the thin film layer, in this embodiment, use the same kind of material with the same type but different properties to form the film layer, so as to achieve the effect of water vapor passage mismatch, which is also one of the im...
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