Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method and device for generating test suggestions for interface testing

An interface testing and interface technology, applied in the field of testing, can solve the problems of missing key test items, low test efficiency, waste of resources, etc., to improve test efficiency, reduce missing test key items, and avoid omissions.

Active Publication Date: 2019-02-15
BEIJING QIHOO TECH CO LTD
View PDF9 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Under the current application development mode, a product is often developed by a team. This will inevitably cause omissions or unclear descriptions when submitting the update scope. When the interface test may deviate, it is easy to miss the key points of the test. Projects, testing non-key projects, waste of resources and other issues, low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and device for generating test suggestions for interface testing
  • A method and device for generating test suggestions for interface testing
  • A method and device for generating test suggestions for interface testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0069] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0070] refer to figure 1 , which shows a flow chart of the steps of a method embodiment for generating a test suggestion for an interface test according to an embodiment of the present invention, which may specifically include the following steps:

[0071] Step 101, constructing a first functional relationship diagram including interface functions for the new version of the application to be tested;

[0072] In the embodiment of the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method and device for generating test suggestions in allusion to interface tests. The method comprises the following steps: constructing a first function relational graph comprising interface functions for the new version of an application to be tested; searching a second function relational graph of the base line version of the application; determining the interface functions influenced by the version updating according to the differences between the first function relational graph and the second function relational graph; and generating test suggestion information in allusion to the interface functions influenced by the version updating. According to the method and device, the manual evaluation of the test objects is avoided, the problem of careless omission or unclear description during the updating range submission carried out by the research personnel is avoided, the omission of test emphases is decreased, the test personnel can have a definite object in view to focus on the test of important projects, and then the resource waste is decreased and the test efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method for generating test suggestions for interface testing and a device for generating test suggestions for interface testing. Background technique [0002] With the widespread application of smart devices, we have now entered the era of mobile Internet. [0003] In order to enhance the functions of the system, the number of current applications is increasing exponentially, and the security, reliability, and functionality of applications have all received great attention and challenges. [0004] Testing is an important means to ensure application quality. Through testing, you can verify whether the application's functions, performance, reliability and other indicators meet the specified requirements. Through systematic and rigorous testing, you can find errors in the application to the greatest extent, thereby reducing the number of errors in the application. legacy bugs. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672
Inventor 蒋文乐冯刚
Owner BEIJING QIHOO TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com