Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-view pointer type instrument identification method and device

A recognition method and multi-view technology, which is applied in the field of multi-view pointer instrument recognition, can solve problems such as unrecognition, and achieve the effects of improving automation, strong robustness, and simplifying manual participation

Inactive Publication Date: 2016-02-03
NANJING 55TH INSTION TECH DEV
View PDF7 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Through the above methods, the present invention overcomes the problem of inability to identify in the case of perspective, translation, affine and other transformations in the traditional instrument identification method, and can accurately identify the readings of the instrument at any angle of view, with a high degree of automation, and meets the needs of power companies. Engineering Application Requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-view pointer type instrument identification method and device
  • Multi-view pointer type instrument identification method and device
  • Multi-view pointer type instrument identification method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] Such as figure 1 As shown, the present invention has five main implementation steps, namely image acquisition and data modeling, instrument automatic positioning, instrument image correction, instrument pointer automatic extraction and instrument reading calculation, the specific implementation of each part is as follows:

[0017] 1. Image acquisition and data modeling

[0018] Such as figure 2 As shown, the camera is used to obtain a high-definition image containing instrument information. There is no positional rotation between the camera and the instrument. First, the instrument image I is manually cropped to record each display scale value S and the corresponding angle value A. According to these information Fit the instrument pointer scale model S=F(A), which is used to calculate the final scale value of the instrument. For the case where the scale of the pointer meter is displayed uniformly or non-uniformly, the relationship between S and the corresponding A sa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-view pointer type instrument identification method and device. The method comprises the following steps of: image acquisition; image pre processing; instrument automatic positioning cutting; instrument image correction; instrument pointer information extraction; and instrument reading automatic generation. According to the multi-view pointer type instrument identification method of the invention, instrument images are corrected, and therefore, the problem of a traditional instrument identification method cannot identify instruments under transformation situations such as perspective, translation and affine can be solved. With the multi-view pointer type instrument identification method and device of the invention adopted, much prior knowledge of instruments is not required, and artificial participation can be simplified, and the automation degree of identification can be improved. The multi-view pointer type instrument identification method and device have high robustness and high recognition accuracy as for surface damage, slight light reflection and slight jitter of instruments.

Description

technical field [0001] The invention relates to the field of digital image processing, in particular to a multi-view pointer instrument recognition method and device, which are applied to embedded engineering products. Background technique [0002] With the development of social science and technology, digital image processing technology and pattern recognition have penetrated into all aspects of social production and life, and among them, the realization of instrument automatic recognition is an urgent need for power companies. At present, most electric power companies still adopt the method of manual inspection for meter readings, which is not only a cumbersome work, but also missed and false detections may occur. The development of digital image processing technology makes it possible to replace manual inspection with automatic instrument inspection. Remote monitoring and automatic identification through cameras do not require manual participation, which not only improves...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/00
CPCG06V20/20
Inventor 吴松野宋文张仑淏
Owner NANJING 55TH INSTION TECH DEV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com