LCD bare chip detection unit framework and detection method

Abstract

The invention relates to an LCD bare chip detection unit framework and a detection method. The LCD bare chip detection unit framework comprises a bare chip carrying table, a light source, a camera, a signal unit and a control unit. The bare chip carrying table is used for containing a bare chip for testing. The light source is arranged below the bare chip carrying table and used for lighting the bare chip. The camera is used for acquiring images of the bare chip and sending the images to the control unit. The signal unit is connected with the bare chip carrying table through a connecting wire and controlled by the control unit. The control unit is usually a computer, is connected with the light source, the camera and the signal unit, can control the light source to send corresponding lighting, can control operation of the camera and receive the image sent by the camera, and can control the signal unit and receive response signals sent by the signal unit. Through the RGB three-color controllable backlight source, colorama lighting with testing signal image corresponding requirements is provided, colorama interference of a common testing light source is reduced, meanwhile, due to the fact that testing signals and testing modes are switched without any mechanism motion, a stable testing environment is provided, and testing accuracy and efficiency are improved.

Description

technical field [0001] The invention relates to an LCD bare chip detection unit structure and a detection method. Background technique [0002] Due to the very small defects of the LCD bare chip inspection, the stability of the whole machine is very high. Currently, the screen switching process in the test generally has a mechanism action, which will cause the camera picture of the whole machine to be unstable and require additional vibration time. Overall test time increased. At the same time, since the backlight source is white light, the LCD monochrome test screen will be affected by other color lights to test the accuracy of the equipment. [0003] In view of the above-mentioned defects, the designer is actively researching and innovating, in order to create a structure and method of LCD bare chip detection unit, so that it has more industrial application value. Contents of the invention [0004] In order to solve the above technical problems, the object of the prese...

AI Technical Summary

Problems solved by technology

[0002] Due to the very small defects of the LCD bare chip inspection, the stability of the whole machine is very high. The screen switching process in the current test generally has a mechanism action, which will cause the camera picture of the whole machine to be unstable and require additional vibration time. Overall test time increased

At the same time, since the backlight source is white light, the LCD monochrome test screen will be affected by other color lights to test the accuracy of the equipment

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