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A Universal Test Fixture for Surface Mount Diode Components

A general-purpose testing and surface-mounting technology, applied in the direction of measuring device housing, etc., can solve the problems of increased production cost, prolonged test cycle, low production efficiency, etc., and achieves the effects of low cost, reduced test cycle extension, and simple structure

Active Publication Date: 2018-02-13
GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Surface mount two-pole components involve resistors, capacitors, diodes and other components, and the package sizes are various. For each package size, it is necessary to make corresponding test fixtures. Making a large number of fixtures consumes a lot of money, resulting in production Increased cost; when testing a new size component, the test fixture must be customized according to the size of the component, resulting in a longer test cycle; when testing, it is necessary to frequently place and remove the tested component in the test fixture, resulting in production efficiency not tall

Method used

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  • A Universal Test Fixture for Surface Mount Diode Components
  • A Universal Test Fixture for Surface Mount Diode Components
  • A Universal Test Fixture for Surface Mount Diode Components

Examples

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Embodiment Construction

[0018] The invention will be further introduced below in conjunction with the accompanying drawings and specific embodiments.

[0019] Such as Figure 1~Figure 3 As shown, a general test fixture for surface mount two-pole components includes a front and rear sliding positioning slider 1, an elastic test probe module 2 and a pull-out base plate 3, and the front and rear sliding positioning slider 1 adopts two sliders The front and back are symmetrically placed, and the screw nut set at the bottom drives the two sliders to move toward each other, and is connected to the guide rail pair 5, and a movable drawer bottom plate 3 is arranged near the bottom, and the drawer base plate 3 is embedded in the sliding body between the sliders. In the slot, the left end of the drawer bottom plate 3 is connected with a reset device that resets the drawer base plate after being drawn out, and an elastic test probe module 2 is arranged between the two sliders on it, and the elastic test probe m...

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Abstract

The invention discloses a universal test fixture for surface-mounted two-pole components, which includes a front and rear sliding positioning slider, an elastic test probe module and a pull-out base plate. The screw and nut set at the bottom drive the two sliding bodies to move towards each other, and there is a movable pull-out bottom plate near the bottom. The test probe module includes elastically expandable left test probes and right test probes placed facing each other. In the present invention, the device under test is placed in a variable placement slot, and the rapid replacement and testing of the device under test can be realized through the fastening of the elastic test probe and the detachment of the drawing bottom plate, and the variable two sliders And the elastic pressure rod can realize the test of different specifications of the device under test, greatly improve the test efficiency and test accuracy, and also has the characteristics of simple structure, convenient operation and use, and low price.

Description

technical field [0001] The invention belongs to the technical field of electronic component testing devices, and relates to a universal testing fixture for surface-mounted two-pole components. Background technique [0002] Surface mount two-pole components involve resistors, capacitors, diodes and other components, and the package sizes are various. For each package size, it is necessary to make corresponding test fixtures. Making a large number of fixtures consumes a lot of money, resulting in production Increased cost; when testing a new size component, the test fixture must be customized according to the size of the component, resulting in a longer test cycle; when testing, it is necessary to frequently place and remove the tested component in the test fixture, resulting in production efficiency not tall. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a universal test fixture for surface-mounted diode compon...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04
Inventor 范春帅陈尔鹏
Owner GUIZHOU AEROSPACE INST OF MEASURING & TESTING TECH
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