Universal test fixture for surface mounted technology (SMT)-based diode components

Abstract

The invention discloses a universal test fixture for surface mounted technology (SMT)-based diode components, which comprises fore-and-aft sliding type positioning sliders, an elastic test probe module and a pull-out base plate. The fore-and-aft sliding type positioning sliders are composed of two sliders that are symmetrically arranged front and back. The two sliders are driven by screw-nut pairs arranged at the bottom thereof to move in opposite directions. The movable pull-out base plate is arranged close to the bottom. The left end of the movable pull-out base plate is connected with a reset device. On the pull-out base plate, the elastic test probe module is arranged between the two sliders. The elastic test probe module comprises a left test probe and a right test probe, wherein the two test probes are elastically flexible and are arranged right opposite to each other. According to the technical scheme of the invention, a to-be-tested component is placed in a variable placement groove. Under the fastening effect of the elastic test probes and the separating effect of the pull-out base plate, the to-be-tested component can be quickly replaced and tested. Meanwhile, by means of the two variable sliders and an elastic pressing bar, to-be-tested components of different specifications can be tested. Therefore, the testing efficiency and the testing precision are greatly improved. The universal test fixture is simple in structure, convenient to operate and use, and low in price.

Description

technical field [0001] The invention belongs to the technical field of electronic component testing devices, and relates to a universal testing fixture for surface-mounted two-pole components. Background technique [0002] Surface mount two-pole components involve resistors, capacitors, diodes and other components, and the package sizes are various. For each package size, it is necessary to make corresponding test fixtures. Making a large number of fixtures consumes a lot of money, resulting in production Increased cost; when testing a new size component, the test fixture must be customized according to the size of the component, resulting in a longer test cycle; when testing, it is necessary to frequently place and remove the tested component in the test fixture, resulting in production efficiency not tall. SUMMARY OF THE INVENTION [0003] The technical problem to be solved by the present invention is to provide a universal test fixture for surface-mounted diode compone...

AI Technical Summary

Problems solved by technology

[0002] Surface mount two-pole components involve resistors, capacitors, diodes and other components, and the package sizes are various. For each package size, it is necessary to make corresponding test fixtures. Making a large number of fixtures consumes a lot of money, resulting in production Increased cost; when testing a new size component, the test fixture must be customized according to the size of the component, resulting in a longer test cycle; when testing, it is necessary to frequently place and remove the tested component in the test fixture, resulting in production efficiency not tall

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