Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Three spectral line interpolation FFT harmonic wave analysis method and system based on multiplication window function

A harmonic analysis and multiplication window technology, applied in the field of harmonic analysis, can solve problems such as spectrum leakage and inability to meet the requirements of high-precision harmonic analysis

Active Publication Date: 2015-09-09
SOUTH CENTRAL UNIVERSITY FOR NATIONALITIES
View PDF6 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The key issue of harmonic detection is: how to solve spectrum leakage and fence effect under asynchronous sampling
[0007] However, in actual engineering use, the commonly used window function interpolation algorithm still cannot meet the high-precision harmonic analysis requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three spectral line interpolation FFT harmonic wave analysis method and system based on multiplication window function
  • Three spectral line interpolation FFT harmonic wave analysis method and system based on multiplication window function
  • Three spectral line interpolation FFT harmonic wave analysis method and system based on multiplication window function

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0137] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0138] see figure 1 As shown, the embodiment of the present invention provides a three-spectrum interpolation FFT harmonic analysis method based on a mutual multiplication window function, comprising the following steps:

[0139] S1. Construct the mutual multiplication window function:

[0140] The general formula of the multiplicative window function is generated by the product of multiple window functions. The general formula of the multiplicative window function w(n) is:

[0141]

[0142] Among them, n is the ordinal number of the sampling point, n is a natural number; m is the number of basic window functions participating in the construction of the multiplication window, and m is a positive integer; w i (n) is the i-th basic window function expression, i=1,2...m; c i is the number of participating in the i-th basic window f...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a three spectral line interpolation FFT (Fast Fourier Transform) harmonic wave analysis method and system based on a multiplication window function, relating to the harmonic wave analysis field. The method comprises the steps of: constructing a multiplication window function; pretreating signals; determining three spectral lines; calculating a correction formula of a three spectral line interpolation algorithm; calculating a fundamental wave parameter; determining a harmonic wave parameter; and performing error analysis. The invention provides a new window function construction mode, utilizes a routine window function to perform different multiplication combinations, firstly realizes construction of a multiplication window function, and applies the multiplication window function to a three spectral line interpolation FFT algorithm to perform harmonic wave analysis and calculate a harmonic wave parameter. According to a plurality of common cosine window function calculation instances, the multiplication window function of the invention has higher accuracy compared with a routine window function interpolation algorithm, and can realize high precision harmonic wave measurement.

Description

technical field [0001] The invention relates to the field of harmonic analysis, in particular to a trispectral interpolation FFT harmonic analysis method and system based on a mutual multiplication window function. Background technique [0002] With the use of a large number of nonlinear power electronic devices, the problem of harmonic pollution in the power grid is becoming more and more serious. Harmonic problems not only deteriorate the power quality, but also have a great impact on the safety, stability and economic operation of the power grid. Therefore, it is very necessary to measure the harmonic parameters in the system with high precision to reduce the harm of harmonics and maintain the safe, stable and efficient operation of the power grid. [0003] The key issue of harmonic detection is: how to solve spectrum leakage and fence effect under asynchronous sampling. At present, common methods for detecting harmonics and interharmonics mainly include: Fourier transf...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R23/16
Inventor 张俊敏刘开培汪立王黎田微陈文娟
Owner SOUTH CENTRAL UNIVERSITY FOR NATIONALITIES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com