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A pressure wave method measuring device for space charge distribution of flat sample

A space charge, flat sample technology, used in measuring devices, measuring electrical variables, instruments, etc., can solve the problems of inaccurate measurement, easy interference of space charge distribution signals, etc., to ensure firm clamping, prevent electromagnetic interference, The effect of reducing the difficulty of processing

Active Publication Date: 2018-03-27
NANJING NARI GROUP CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The space charge measurement of flat sample based on the pressure wave method, the space charge distribution signal is easily disturbed, and the measurement is inaccurate

Method used

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  • A pressure wave method measuring device for space charge distribution of flat sample
  • A pressure wave method measuring device for space charge distribution of flat sample

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Embodiment Construction

[0032] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0033] Such as figure 1 As shown, a flat sample space charge distribution pressure wave method measurement device, including high voltage DC power supply 1, high voltage lead wire 2, signal shielding box 6, current limiting resistor 7, DC blocking capacitor 8, coaxial cable 9, sample shielding Box 11 , electrode measurement unit 100 , amplifier 20 , digital oscilloscope 21 , metal support 22 , high temperature drying box 24 , and laser 25 .

[0034] The current limiting resistor 7 and the DC blocking capacitor 8 are arranged in the signal shielding box 6 .

[0035] The electrode measurement unit 100 is set in the sample shielding box 11 , the sample shielding box 11 and the metal support 22 are set in the high temperature drying oven 24 , and the sample shielding box 11 is set on the metal support 22 .

[0036] Both the sample shiel...

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PUM

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Abstract

The present invention discloses a flat sample space charge distribution pressure wave method measuring device, including a high voltage DC power supply (1), a high voltage lead wire (2), a signal shielding box (6), a current limiting resistor (7), and a DC blocking capacitor (8), coaxial cable (9), sample shielding box (11), electrode measurement unit (100), amplifier (20), digital oscilloscope (21), metal pillar (22), high temperature drying oven (24), Laser (25); the invention can accurately measure the space charge distribution in the electrical insulating material, effectively eliminate external interference, and realize the measurement of space charge at different temperatures through the corresponding heating device, and realize the measurement of the space charge in the flat sample insulating material under DC high voltage. Space charge distribution measurement; use the sample shielding box to place the electrode system, use the signal shielding box to place the pressurized circuit such as the high voltage lead wire and the measuring circuit such as the DC blocking capacitor to prevent electromagnetic interference from the external environment.

Description

technical field [0001] The invention relates to a pressure wave method measuring device for the space charge distribution of a flat sample, in particular to a space charge measurement system based on the pressure wave method. Background technique [0002] Electrically insulating materials result in the formation of internal defects due to defects in their molecular structure. Under the action of the electric field, the carriers move along the direction of the electric field. When these carriers encounter the formed defects, they will be trapped by them, forming corresponding space charges. The Coulomb field and the applied electric field formed by these space charges will change the distribution of the original electric field, resulting in serious distortion of the electric field in the material, which will cause the development of the electric tree and lead to the destruction of the insulation. Therefore, space charge seriously affects the performance of electrical insulat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/00
Inventor 朱智恩杨黎明郭世忠李栋
Owner NANJING NARI GROUP CORP
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