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Spectralon diffuse reflection plate correcting method

A technology of diffuse reflection plate and correction method, which is applied in the direction of testing optical performance, etc., can solve the problems of inapplicability of general equations and large differences of BaSO4 plates, etc., and achieve the effect of shortening the time

Active Publication Date: 2015-07-29
ZHEJIANG UNIV
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Problems solved by technology

The results show that the 11 kinds of Spectralon diffuse reflectors have small differences in orientation / hemisphere, orientation / orientation, and a general equation is proposed for Spectralon diffuse reflectors, while BaSO 4 Due to the large variance in the experimental process, the general equation is not applicable

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  • Spectralon diffuse reflection plate correcting method
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  • Spectralon diffuse reflection plate correcting method

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Embodiment Construction

[0065] The present invention will be further described below in conjunction with accompanying drawing description, concrete steps are as follows:

[0066] 1) Select the Spectralon diffuse reflection plate of Shanghai Lanfei Optics. In the range of 250-2500nm, except for 250nm, 2400nm, 2450nm and 2500nm, with a step size of 50nm, the ρ relative to the Lambertian body incident at a zenith angle of 8° H The values ​​have been calibrated, where the minimum value is 0.992 and the maximum value is 0.998.

[0067] 2) Turn on the light source, spectrometer, and stabilize for more than 15 minutes.

[0068] 3) Adjust the azimuth angle of the light source to 0°, and fix the zenith angle to 0°, 10°, 30° and 45° in turn; in order to avoid CCD exposure, set the optimal integration time.

[0069] 4) Manually rotate and control the detector so that the zenith angle is collected every 10° from 0° to 70°, and the azimuth angle is collected every 10° from 0° to 360°.

[0070] 5) The Spectralon...

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Abstract

The invention discloses a Spectralon diffuse reflection plate correcting method. The method comprises the steps: 1) illuminating the Spectralon diffuse reflection plate from different zenith angles by a light source, and using the spectrograph to collect the corresponding reflection spectroscopic data from the different zenith angles and the azimuth angles; 2) intercepting the spectroscopic data within the valid wave band range from the reflection spectroscopic data, calculating the average value, and eliminating the spectroscopic data with relatively large difference; 3) calculating the residual sum of squares Rss of the residual spectroscopic data, determining the value of the most stable probe receiving zenith angle (thetar, degree), and establishing the relational expression of the random probe receiving zenith angle thetar and (thetar, degree); and 4) substituting the relational expression to the BRDF expression of the Spectralon diffuse reflection plate, and finishing the Spectralon diffuse reflection plate correction. The method is capable of using the known data of the Spectralon diffuse reflection plate to correct, calculating the universal expression of the probe receiving zenith angle orientation, and shortening the time for the follow-up test process.

Description

technical field [0001] The invention relates to the field of optical property detection, in particular to a correction method for a Spectralon diffuse reflection plate. Background technique [0002] When collecting the BDRF optical properties of planar samples, the incident radiance value is difficult to measure, and a standard plate needs to be used instead. There are four criteria for the selection of standard boards: [0003] 1) For the diffuse reflectance standard plate used to detect irradiance, its own BRDF characteristics need to be known; [0004] 2) The standard plate should have good approximate Lambertian characteristics and high reflection value; [0005] 3) When used as a reference measurement, the size of the standard plate should be able to be covered by the field of view (Field of View, FOV) of the detector; [0006] 4) It is necessary to ensure that the BRDF value of the standard plate is stable during the measurement process. [0007] The chemical compo...

Claims

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Application Information

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IPC IPC(8): G01M11/02
Inventor 方慧张昭张畅杜朋朋刘飞何勇
Owner ZHEJIANG UNIV
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