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Method for sufficiently utilizing memory redundancy unit

A technology of redundant units and storage units, applied in the field of data communication, can solve problems such as waste, and achieve the effects of increasing utilization rate, increasing speed, and reducing complexity

Inactive Publication Date: 2015-05-13
SHANDONG HUAYI MICRO ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If there are defective storage cells in some rows or columns, spare cells are used to replace them; if a row or column or all storage cells are intact, the spare cells corresponding to the row or column are idle and useless. is a waste

Method used

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  • Method for sufficiently utilizing memory redundancy unit
  • Method for sufficiently utilizing memory redundancy unit
  • Method for sufficiently utilizing memory redundancy unit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] The following uses the column redundancy unit as the check code of this row as an example to calculate the check code. When erasing part of a row, the method of calculating the check code can be performed as follows:

[0038] Such as figure 1 As shown, C0-C7 are storage units of the EEPROM, C8 is a column redundancy unit, and the check code stored in C8 is generated using a parity check method. Assume that the storage in C0-C7 is {1'b0, 1'b1, 1'b0, 1'b1, 1'b0, 1'b1, 1'b0, 1'b1}, and assume that the generation method of C8 is even proof Test, then C8 should be 1'b0.

[0039] If part of the value of C0-C7 changes, since the parity check method is a linear change, you only need to know the data before the data change, the data after modification and the original check code to calculate the new check code. . For example, if C0 and C1 change, according to the calculation formula of odd parity, , now C0, C1 change to , , the new check code should be:

[0040]

...

Embodiment 2

[0046] The following takes the row redundancy unit as the check code of the whole storage unit or a part of the storage unit as an example. When erasing and writing part of a row, the method of calculating the check code can be performed as follows:

[0047] Such as figure 2 As shown, R8 is a row redundancy unit, and C8 is a column redundancy unit (in bytes). The CHECK_R0 byte of R8 row is the check byte of R0 row, CHECK_R1 is the check byte of R1 row, and so on, and CHECK_R7 is the check byte of R7 row.

[0048] Taking even parity as an example, then

[0049] ,

[0050] Same as the derivation in Example 1, if BYTE_R0C0 changes to , the new check code is:

[0051] That is, it only needs to know the value of the data before modification, the value of the data after modification and the original check code at the position of the changed part of the data, and then the new check code can be calculated. However, since EEPROM has the characteristic that erasing and writin...

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Abstract

The invention discloses a method for sufficiently utilizing a memory redundancy unit. A memory comprises a storage unit and a redundancy unit, wherein the redundancy unit comprises a row redundancy unit and a column redundancy unit, and check codes are stored in the redundancy unit. The column redundancy unit can be used as a row check code, and the row redundancy unit can be used as a check code of the whole storage unit or partial storage unit. By storing the check codes in a standby redundancy unit on the premise that the storage unit of the memory is not damaged, the correctness and the integrity of data are checked by utilizing the check codes, and error correction is carried out, so that the purpose of sufficiently utilizing the redundancy unit is achieved, and the utilization rate of the redundancy unit is improved.

Description

technical field [0001] The invention relates to a method for making full use of memory redundant units, belonging to the technical field of data communication. Background technique [0002] In the field of memory design, its capacity has reached T(=2 10 G) level, the most advanced size in the world is around 20 nanometers. With the continuous expansion of memory capacity and the continuous shrinking of process dimensions, it is inevitable to introduce various defects in the memory production process, resulting in some cells of the memory being unable to be used correctly. [0003] Aiming at this problem, a commonly used solution at present is to add an additional part of storage cells at the end of the row or column of the memory as a backup. If there are defective storage cells in some rows or columns, spare cells are used to replace them; if a row or column or all storage cells are intact, the spare cells corresponding to the row or column are idle and useless. is a was...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/42
Inventor 邓波王明宇李向宏
Owner SHANDONG HUAYI MICRO ELECTRONICS
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