Power line interference test system and method

Abstract

The invention provides a power line interference test system which is formed by connecting a mainframe, a power supply and a device to be tested with one another. By means of the system, a power line interference test method can be executed. The mainframe controls the power supply to conduct a test mode on the device to be tested, then whether the mainframe can be connected with the device to be tested or not is determined, if yes, an error checking program is executed, and if not, a latch checking program is executed; the error checking program is checked by the device to be tested, the mainframe determines whether a checking result is received or not and then conducts recording, the latch checking program waits for restart of the device to be tested and then conducts recording after determining that the device to be tested is restarted successfully or the device to be tested cannot be restarted, and thus automation of the power line interference test is achieved.

Description

technical field [0001] The invention relates to testing equipment and a testing method for electronic products, in particular to a power line interference testing system and testing method for electronic products, which can perform automatic testing to improve the efficiency and quality of power line interference testing. Background technique [0002] In order to ensure the stable operation of electronic products, most electromagnetic susceptibility (EMS) tests will be carried out to confirm the ability of electronic products to resist electromagnetic interference. Among them, IEC 61000-4-11 provides an AC input voltage instantaneous drop ( Voltage Dips), short-term interruption (Interruption) and voltage gradient (Voltage Variation) immunity test specifications, referred to as power line disturbance (Power Line Disturbance, PLD) test. The aforementioned specifications classify the anti-interference ability of electronic products into three levels: Error Free, Latch-up Free,...

AI Technical Summary

Problems solved by technology

[0003] The current power supply can provide the AC waveform and test conditions required by the test specification to the device under test, but it cannot detect the state of the electronic product under test and judge whether there is an error.

Therefore, the existing power line interference test is to manually operate the power supply to output a specific waveform to the product under test, and to judge the state of the product under test by human observation, and the product under test often has a new signal during the test process. The phenomenon of power-on causes the overall test time to be lengthy, and also causes testers to waste a lot of time waiting for the product to be tested to restart

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