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Tantalum target and manufacturing method thereof

A technology for tantalum targets and tantalum ingots, applied in the field of tantalum targets and their preparation, can solve the problems of increased difficulty, increased size of sputtering targets, and inability to provide tantalum targets, and achieves large size, compactness and high quality. The effect of good texture distribution uniformity, uniform structural properties and microstructure

Active Publication Date: 2015-03-25
NINGXIA ORIENT TANTALUM IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the increase of wafer size and the reduction of wiring width due to the increase of integration, on the one hand, the required sputtering target size increases, especially for target users to reduce costs and increase For target use efficiency, thicker sputtering tantalum targets are used, which further leads to an increase in the size of sputtering targets. For the preparation of larger sputtering tantalum targets, it is more difficult to ensure the uniformity of the structure; On the one hand, due to the reduced line width, higher requirements are placed on the microstructure size and composition of sputtering targets
However, Ta target manufacturers in the industry cannot provide tantalum targets with larger diameters and thicknesses for semiconductor coatings, and have smaller microstructure sizes and uniform texture components.

Method used

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  • Tantalum target and manufacturing method thereof
  • Tantalum target and manufacturing method thereof
  • Tantalum target and manufacturing method thereof

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preparation example Construction

[0039] The invention discloses a method for preparing a tantalum target, which comprises the following steps:

[0040] A) After the tantalum ingot is forged for the first time, a forging blank is obtained;

[0041] B) After the primary forging blank obtained in the above steps is subjected to the second forging and the first heat treatment, the secondary forging blank is obtained;

[0042] C) after the secondary forging blank obtained in the above steps is subjected to the third forging and the second heat treatment, the third forging blank is obtained;

[0043] D) after the third forging blank obtained in the above steps is subjected to the fourth forging and the third heat treatment, four forging blanks are obtained;

[0044] E) After the four forging blanks obtained in the above steps are rolled and subjected to the fourth heat treatment, a tantalum target is obtained;

[0045] The first forging is rotary forging; the temperature of the first forging is 800-1400°C.

[0046...

Embodiment 1

[0062] A tantalum ingot with a chemical composition of Ta≥99.99% and a diameter of Φ=300mm is selected.

[0063] First, after the first hot forging (rotary forging) of the tantalum ingot at 1100°C, the tantalum ingot is axially elongated and radially rounded to a diameter of Φ=145mm to obtain a primary forging billet.

[0064] Then saw the above-mentioned primary forging billet to L=340mm, carry out the second forging under the condition of 1100°C (axial pier rough drawing and long forging), axial upsetting and drawing 3 times, each time upsetting to H=200, After pulling out long and square to side length □=130mm; then use HCl:HF:H 2 SO 4 The mixed acid with a volume ratio of 5:3:2 pickled the first forging billet after the second forging, until the surface impurities were removed, and the tantalum metal was shiny and free of speckles when observed with the naked eye, and then the second forging was carried out at 1200°C. A heat treatment, after 90 minutes of treatment, a se...

Embodiment 2

[0071] A tantalum ingot with a chemical composition of Ta≥99.99% and Φ=300mm is selected.

[0072] First, after the first hot forging (rotary forging) of the tantalum ingot at 1100°C, the tantalum ingot is axially elongated and radially rounded to a diameter of Φ=145mm to obtain a primary forging billet.

[0073] Then saw the above-mentioned primary forging billet to L=340mm, carry out the second forging under the condition of 1100°C (axial pier rough drawing and long forging), axial upsetting and drawing 3 times, each time upsetting to H=200, After pulling out long and square to side length □=130mm; then use HCl:HF:H 2 SO 4 The mixed acid with a volume ratio of 5:3:2 pickled the first forging billet after the second forging, until the surface impurities were removed, and the tantalum metal was shiny and free of speckles when observed with the naked eye, and then the second forging was carried out at 1200°C. The first heat treatment, after 90 minutes of treatment, the second...

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Abstract

The invention provides a tantalum target and a manufacturing method thereof; the manufacturing method comprises the steps: firstly, performing a first forging to a tantalum ingot and obtaining a primary forged blank; performing a second forging and a first thermal treatment to the primary forged blank obtained in the previous step and obtaining a secondary forged blank; performing a third forging and a second thermal treatment to the secondary forged blank obtained in the previous step and obtaining a tertiary forged blank; performing a fourth forging and a third thermal treatment to the tertiary forged blank obtained in the previous step and obtaining a quartus forged blank; and finally, rolling and performing a fourth thermal treatment to the quartus forged blank obtained in the previous step and obtaining the tantalum target; the first forging is a rotary forging; the temperature of the first forging is 800-1400 degrees centigrade. The prepared tantalum target is uniform in texture distribution, small in grain size and capable of satisfying usage requirements in high-level semiconductor film-coating industries.

Description

technical field [0001] The invention belongs to the technical field of target preparation, and in particular relates to a tantalum target and a preparation method thereof. Background technique [0002] The coating target is a sputtering source that forms various functional films on the substrate by sputtering under appropriate process conditions through magnetron sputtering, multi-arc ion plating or other types of coating systems. In a simple sense, the target is a high-speed charge target material for particle bombardment. [0003] With the rapid development of sputtering targets and sputtering technology in recent years, it has greatly met the needs of the development of various new electronic components. Displays and surface coatings of workpieces have been widely used. In the flat panel display industry, the synchronous development of various display technologies (such as LCD, PDP, OLED and FED, etc.), some have been used in the manufacture of computer and computer dis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/34C22F1/18
CPCC22F1/18C23C14/3407
Inventor 李兆博汪凯李桂鹏宿康宁李小平马小文赵玉林
Owner NINGXIA ORIENT TANTALUM IND
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