Scanning tunneling microscope scanning probe head
A technology for scanning probes and tunnels, applied in the field of scanning probes, can solve the problems of large, complex and unstable design structures, and achieve the effects of low noise, high rigidity and high stability
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[0021] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0022] This embodiment provides a scanning tunneling microscope scanning probe, its three-dimensional structure is as follows: figure 1 As shown, it includes the sample seat 11 and the side plates 31 and 32 on both sides thereof, and the cavity surrounded by the sample seat 11 and the side plates 31 and 32 has the scanning base 2 . figure 2 for figure 1 A cross-sectional view of the scanning probe is shown, as figure 2 As shown, the scanning probe includes:
[0023] The sample holder 11 has a groove, which is used to place a sample holder 12 with a sample 13 in the groove;
[0024] The scanning base 2 is used ...
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